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  • 1
    Electronic Resource
    Electronic Resource
    Near-Field Scanning Optical Microscopy Combined with a Tapping Mode Atomic Force Microscope (1997)
    Springer
    Optical review 4 (1997), S. 297-299 
    Details
    ISSN: 1349-9432
    Keywords: near-field optics ; microscopy ; tapping mode ; atomic force microscope ; scattering
    Source: Springer Online Journal Archives 1860-2000
    Topics: Physics
    Notes: Abstract Tapping mode atomic force microscopy is used to control the tip-sample distance in near field scanning optical microscopy (NSOM), which gives both topographic and near-field images simultaneously. The evanescent waves are scattered by a vibrating silicon-nitride tip in the proximity of sample surfaces and are detected through a microscope objective. This NSOM allows the observation of opaque samples with reflection illumination. A glass grating of 1-μm pitch and an InP grating of 0.5-μm pitch are observed with a lateral resolution of 100 nm.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1007/s10043-997-0297-5
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