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Depth profiling in surface regions of oxidized metal alloys by low energy PIXE (1987)

Drüke, V. ; Hecker, R. ; Stöver, D.

Springer

Microchimica acta 91 (1987), S. 85-91

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ISSN: 1436-5073

Keywords: depth profiling ; low energy PIXE ; metal oxides

Source: Springer Online Journal Archives 1860-2000

Topics: Chemistry and Pharmacology

Notes: Abstract As a nondestructive technique for depth profiling of elements the PIXE-method was applied to determine the concentration profile of elements in the near surface of oxidized metal alloys. The outer region of about 1 μm was investigated using low energy protons for X-ray excitation. A set of X-ray yield measurements was carried out at proton energies of 150 to 300 keV. The unfolding of the X-ray yields was performed by calculation of proton energy loss, X-ray production cross section and X-ray attenuation.

Type of Medium: Electronic Resource

URL: http://dx.doi.org/10.1007/BF01199481

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