ISSN:
1436-5073
Keywords:
depth profiling
;
low energy PIXE
;
metal oxides
Source:
Springer Online Journal Archives 1860-2000
Topics:
Chemistry and Pharmacology
Notes:
Abstract As a nondestructive technique for depth profiling of elements the PIXE-method was applied to determine the concentration profile of elements in the near surface of oxidized metal alloys. The outer region of about 1 μm was investigated using low energy protons for X-ray excitation. A set of X-ray yield measurements was carried out at proton energies of 150 to 300 keV. The unfolding of the X-ray yields was performed by calculation of proton energy loss, X-ray production cross section and X-ray attenuation.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1007/BF01199481
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