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Optical determination of the thickness of single planar thin lipid films using the symmetrical three-layer model (1988)

Möglich, P. M. ; Kretzschmar, G.

Springer

Colloid & polymer science 266 (1988), S. 739-744

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ISSN: 1435-1536

Keywords: Membrane ; thin liquid film ; bilayer ; optical method ; three-layer model ; lipid film

Source: Springer Online Journal Archives 1860-2000

Topics: Chemistry and Pharmacology , Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics

Notes: Abstract The total thickness of thin lipid films can be determined by the method of absolute or relative reflectance measurements. The film is described by the symmetrical three-layer model. By assuming equal refractive indices for the hydrocarbon layer and for the organic solution, the thickness and refractive index of the head group layer can be estimated.

Type of Medium: Electronic Resource

URL: http://dx.doi.org/10.1007/BF01410284

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