ISSN:
1572-9559
Keywords:
Near-millimeter wave
;
far-infrared
;
millimeter wave
;
sub-millimeter
;
spectroscopy
;
materials
;
refractive index
;
absorption coefficient
;
dielectric constant
;
loss tangent
Source:
Springer Online Journal Archives 1860-2000
Topics:
Physics
Notes:
Abstract We have used non-dispersive Fourier-transformspectroscopic techniques to measure the complex indices of refraction of materials between frequencies of 120 and 550 GHz. Results are presented for crystal quartz, crosslinked polystyrene (Rexolite 1422), glass-loaded polytetrafluoroethylene (Duroid 5880) and a nickel ferrite (Trans-Tech 2-111). These results are compared with other data on these materials in this frequency range. The accuracy of these measurements yields a considerable improvement in the near-millimeter-wave characterization of several of these materials. For materials other than crystal quartz, our results are the first measurements of their properties over the entire frequency range studied.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1007/BF01014034
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