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  • 68.45Da  (1)
  • X-ray diffraction  (1)
  • X-ray diffraction method  (1)
  • Springer  (3)
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  • Springer  (3)
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  • 1
    Electronic Resource
    Electronic Resource
    The application of photoemission microscopy to the study of heterogeneous reactions over metal single crystal surfaces (1989)
    Springer
    Applied physics 49 (1989), S. 399-402 
    Details
    ISSN: 1432-0630
    Keywords: 79.60.−i ; 61.16.Di ; 68.35.Bs ; 68.45Da
    Source: Springer Online Journal Archives 1860-2000
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics , Physics
    Notes: Abstract The development of UHV instrumentation for photoemission electron microscopy (PEEM) has opened up the possibility of investigating in situ the morphology of metal single crystal surfaces during simple catalytical reactions in the pressure range up to 10−4 mbar. We have studied the Pt(100) surface during the transition from the high to low rate branches of the CO oxidation reaction. Steps, step bunches and grain boundaries have been identified. They play an important role in the decomposition of CO and the deposition of carbon and probably regulate the reactivity of the Pt surface.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1007/BF00615023
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  • 2
    Electronic Resource
    Electronic Resource
    Temperature resolved X-ray diffraction as a tool of thermal analysis (1997)
    Springer
    Journal of thermal analysis and calorimetry 49 (1997), S. 1025-1037 
    Details
    ISSN: 1572-8943
    Keywords: crystallographic evaluation ; evaluation with difference procedure ; kinetics ; Rietveld refinement ; X-ray diffraction ; temperature resolved
    Source: Springer Online Journal Archives 1860-2000
    Topics: Chemistry and Pharmacology
    Notes: Abstract Time and temperature resolved X-ray diffraction was used for thermal analysis. Series of diffraction patterns were measured, while the samples are heated/cooled stepwise or isothermally with freely selectable temperature programs. The method was applied for the investigation of the phase transitions of ammonium nitrate and HMX (1,3,5,7-tetranitro-1,3,5,7-tetraaza-cyclooctane), when the identification of phases was required. Its capability in the field of kinetics is demonstrated with the isothermal investigation of the solid state reaction of ammonium nitrate with copper oxide and the non-isothermal investigation of the high temperature corrosion of nickel, which was performed by means of a difference procedure. For obtaining structural details peak fitting and Rietveld refinement were applied for the investigation of ammonium nitrate and HMX.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1007/BF01996790
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  • 3
    Electronic Resource
    Electronic Resource
    Non-isothermal kinetics of high temperature oxidation studied by a fast X-ray diffraction method (1992)
    Springer
    Journal of thermal analysis and calorimetry 38 (1992), S. 649-655 
    Details
    ISSN: 1572-8943
    Keywords: corrosion ; high temperature oxidation ; non-isothermal kinetics ; X-ray diffraction method
    Source: Springer Online Journal Archives 1860-2000
    Topics: Chemistry and Pharmacology
    Description / Table of Contents: Zusammenfassung Unter Anwendung eines Diffraktometers mit einer Hochtemperatureinheit wurde unterhalb 570°C mittels Röntgendiffraktion die Oxidation von Fe-ARMCO untersucht. Die Oxidationsprodukte wurden in situ bestimmt und das Differenzverfahren ergabY(T)-Kurven, die die globalen Änderungen zeigen. Diese Kurven wurden anhand der mikroskopisch bestimmten resultierenden Dicken der Oxidschicht kalibriert, wobei man die Funktionx(T) erhält. Dieser Kurve wurde eine berechnete, die Arrheniussche Beziehung enthaltende Funktion angepaßt, wodurch man die Aktivierungsenergie und die Oxidations Geschwindigkeitskonstante als Funktion der Temperatur erhält.
    Notes: Abstract Temperature resolved X-ray diffraction using a diffractometer equipped with a high temperature device was applied to the study of the oxidation of Fe-ARMCO below 570°C. The oxidation products are identified in situ and the difference method yields curvesY(T) showing the global changes. These curves were calibrated to the microscopically measured end thickness of the oxide layer obtaining the growthx(T). A calculated curve including the Arrhenius relation was fitted to thex(T) curve yielding activation energy and values of the oxidation rate constant as a function of temperature.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1007/BF01979393
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