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Non-isothermal kinetics of high temperature oxidation studied by a fast X-ray diffraction method

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Abstract

Temperature resolved X-ray diffraction using a diffractometer equipped with a high temperature device was applied to the study of the oxidation of Fe-ARMCO below 570°C. The oxidation products are identified in situ and the difference method yields curvesY(T) showing the global changes. These curves were calibrated to the microscopically measured end thickness of the oxide layer obtaining the growthx(T). A calculated curve including the Arrhenius relation was fitted to thex(T) curve yielding activation energy and values of the oxidation rate constant as a function of temperature.

Zusammenfassung

Unter Anwendung eines Diffraktometers mit einer Hochtemperatureinheit wurde unterhalb 570°C mittels Röntgendiffraktion die Oxidation von Fe-ARMCO untersucht. Die Oxidationsprodukte wurden in situ bestimmt und das Differenzverfahren ergabY(T)-Kurven, die die globalen Änderungen zeigen. Diese Kurven wurden anhand der mikroskopisch bestimmten resultierenden Dicken der Oxidschicht kalibriert, wobei man die Funktionx(T) erhält. Dieser Kurve wurde eine berechnete, die Arrheniussche Beziehung enthaltende Funktion angepaßt, wodurch man die Aktivierungsenergie und die Oxidations Geschwindigkeitskonstante als Funktion der Temperatur erhält.

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Kolarik, V., Juez-Lorenzo, M., Eisenreich, N. et al. Non-isothermal kinetics of high temperature oxidation studied by a fast X-ray diffraction method. Journal of Thermal Analysis 38, 649–655 (1992). https://doi.org/10.1007/BF01979393

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  • DOI: https://doi.org/10.1007/BF01979393

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