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  • 1
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    Status of the Stellar X-Ray Polarimeter for the Spectrum-X-Gamma mission (1991)
    In:  Other Sources
    Details
    Publication Date: 2019-06-28
    Description: The Stellar X-Ray Polarimeter (SXRP) uses the polarization sensitivity of a graphite Bragg crystal and a lithium Thomsom scattering target to measure the polarization of X-rays from astrophysical sources. The SXRP is a focal plane detector for the Soviet-Danish SODART telescopes which will be launched on the Soviet Spectrum-X-Gamma mission. The SXRP will be the third orbiting stellar X-ray polarimeter, and should provide an order of magnitude increase in polarization sensitivity over its predecessors.
    Keywords: SPACECRAFT INSTRUMENTATION
    Type: In: Production and analysis of polarized X rays; Procedings of the Meeting, San Diego, CA, July 23, 24, 1991 (A93-33470 12-90); p. 106-117.
    Format: text
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    NASA TECHNICAL REPORTS
  • 2
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    Predicted performance of the lithium scattering and graphite crystal polarimeter for the Spectrum-X-Gamma mission (1991)
    In:  Other Sources
    Details
    Publication Date: 2019-07-13
    Description: X-ray scattering from a lithium disk and Bragg reflection from a mosaic graphite crystal can be exploited to measure the linear polarization of radiation emitted from cosmic X-ray sources. The sensitivity is greatly enhanced if these polarimeters are placed at the focus of an X-ray telescope. Such devices form two of the three components of the Stellar X-Ray Polarimeter experiment scheduled to fly on the Spectrum-X-Gamma mission. The experiment will reside at the focus of one of the SODART X-ray telescopes. The expected on-axis performance of these two components of the Stellar X-Ray Polarimeter experiment based on detailed Monte-Carlo simulation is described. Various systematic effects, both external and internal to the experiment, that must be considered in order to properly design and utilize the experiment are also discussed.
    Keywords: SPACECRAFT INSTRUMENTATION
    Type: X-ray/EUV Optics for Astronomy, Microscopy, Polarimetry and Projection Lithography; Jul 09, 1990 - Jul 13, 1990; San Diego, CA; United States
    Format: text
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    NASA TECHNICAL REPORTS
  • 3
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    On the performance of the scattering and crystal polarimeters for the Spectrum-X-Gamma mission (1990)
    In:  Other Sources
    Details
    Publication Date: 2019-07-13
    Description: X-ray scattering from a lithium disk and Bragg reflection from a mosaic graphite crystal can be exploited to measure the linear polarization of radiation emitted from cosmic X-ray sources. The sensitivity is enhanced if the polarimeters are placed at the focus of an X-ray telescope. Such devices form two of the components of the Stellar X-ray Polarimeter experiment scheduled to fly on the Spectrum-X-Gamma mission. The expected on-axis performance of the two components is described based on detailed Monte Carlo simulations. The polarimetry experiment is expected to provide sensitive measurements of linear polarization for many cosmic X-ray sources. The nature and utility of such observations is described for pulsing X-ray sources such as the Crab pulsar and Her X-1.
    Keywords: SPACECRAFT INSTRUMENTATION
    Type: Polarimetry: Radar, Infrared, Visible, Ultraviolet, and X-ray; May 15, 1990 - May 17, 1990; Huntsville, AL; United States
    Format: text
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    NASA TECHNICAL REPORTS
  • 4
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    Bragg crystal polarimeter for the Spectrum-X-Gamma mission (1991)
    In:  Other Sources
    Details
    Publication Date: 2019-07-13
    Description: A Bragg crystal polarimeter for the focal plane of the SODART telescope on the Spectrum-X-Gamma mission is being designed. A mosaic graphite crystal will be oriented at 45 deg to the optic axis of the telescope, thereby preferentially reflecting those X-rays which satisfy the Bragg condition and have electric vectors that are perpendicular to the plane defined by the incident and reflected photons. The reflected X-rays will be detected by an imaging proportional counter with the image providing direct X-ray aspect information. The crystal will be about 50 microns thick to allow X-rays with energies of 4 keV or greater to be transmitted to a lithium block mounted below the graphite. The lithium is used to measure the polarization of these high energy X-rays by exploiting the polarization dependence of Thomson scattering. The development of thin mosaic graphite crystals is discussed and recent reflectivity, transmission, and uniformity measurements are presented.
    Keywords: SPACECRAFT INSTRUMENTATION
    Type: X-ray/EUV Optics for Astronomy, Microscopy, Polarimetry and Projection Lithography; Jul 09, 1990 - Jul 13, 1990; San Diego, CA; United States
    Format: text
    Location Call Number Expected Availability
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    NASA TECHNICAL REPORTS
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