ISSN:
1573-4889
Keywords:
Rutherford backscattering
;
Fe-24Cr Y-implantation
;
Cr2O3
;
cation diffusion
Source:
Springer Online Journal Archives 1860-2000
Topics:
Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
Notes:
Abstract We have investigated the effect of Y ion implantation on the high-Temperature oxidation of Fe-24Cr using Rutherford-backscattering spectroscopy, secondary ion mass spectroscopy, and analytical electron microscopy. Results indicate that implantation of Y has a very large effect on the growth rate of the oxide compared to metals alloyed with Y. Analytical tools have been applied to determine the spatial distribution of Y, the microstructure of the oxide, and contribution of oxygen transport to the oxidation process. Results are compared with those of recent cation-diffusion measurements in Cr2O3 and Cr2O3 doped with Y2O3.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1007/BF00846686
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