Abstract
We have investigated the effect of Y ion implantation on the high-Temperature oxidation of Fe-24Cr using Rutherford-backscattering spectroscopy, secondary ion mass spectroscopy, and analytical electron microscopy. Results indicate that implantation of Y has a very large effect on the growth rate of the oxide compared to metals alloyed with Y. Analytical tools have been applied to determine the spatial distribution of Y, the microstructure of the oxide, and contribution of oxygen transport to the oxidation process. Results are compared with those of recent cation-diffusion measurements in Cr2O3 and Cr2O3 doped with Y2O3.
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King, W.E., Grabowski, K.S., Mitchell, D.F. et al. Rutherford-backscattering study of high-temperature oxidation of Y-implanted Fe-24Cr. Oxid Met 31, 181–207 (1989). https://doi.org/10.1007/BF00846686
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DOI: https://doi.org/10.1007/BF00846686