Publication Date:
2011-08-16
Description:
This paper describes a simple but satisfactory new method for the preparation of tiny, varied and specialized specimens for electron or ion-microprobe analysis developed over the past five years. Microtektites, individual chondrules, single grains, blebs from lunar samples and meteoritic minerals have been prepared by this technique. A description of the preparation of these usually difficult samples from the initial mounting through the various polishing steps to their final polish is presented in detail. The procedures used to prevent any contamination of these specimens by the polishing agents and to prevent cross contamination to the other samples used for geochronology studies are presented.
Keywords:
INSTRUMENTATION AND PHOTOGRAPHY
Type:
Meteoritics; 8; Sept. 30
Format:
text
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