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  • Electron microscopy determinations (including scanning tunneling electron microscopy methods)  (1)
  • Engineering General  (1)
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  • 1
    Electronic Resource
    Electronic Resource
    The transport and switching of Xe atoms on the Ni-W interface of a scanning tunnelling microscope (1993)
    Springer
    Il nuovo cimento della Società Italiana di Fisica 15 (1993), S. 451-457 
    Details
    ISSN: 0392-6737
    Keywords: Electron microscopy determinations (including scanning tunneling electron microscopy methods) ; Other topics in nonelectronic transport properties ; Geometry ; atomic and molecular orientation ; crystal shapes ; surface topography
    Source: Springer Online Journal Archives 1860-2000
    Topics: Physics
    Notes: Summary The transport and switch of Xe atoms on the Ni-W interface of a scanning tunnelling microscope have been analysed for different geometries as a function of the tip position with respect to the Ni(110) surface. Our results show that the control of the different experimental results can only be achieved by a precise control of the position of the tip on the sample. In particular, the tip-sample Xe switch can only be obtained within tip heights of 0.2Å.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1007/BF02456927
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  • 2
    Electronic Resource
    Electronic Resource
    A simple triangular element for thick and thin plate and shell analysis (1994)
    Chichester [u.a.] : Wiley-Blackwell
    International Journal for Numerical Methods in Engineering 37 (1994), S. 2569-2582 
    Details
    ISSN: 0029-5981
    Keywords: Engineering ; Engineering General
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Mathematics , Technology
    Notes: A new plate triangle based on Reissner-Mindlin plate theory is proposed. The element has a standard linear deflection field and an incompatible linear rotation field expressed in terms of the mid-side rotations. Locking is avoided by introducing an assumed linear shear strain field based on the tangential shear strains at the mid-sides. The element is free of spurious modes, satisfies the patch test and behaves correctly for thick and thin plate and shell situations. The element degenerates in an explicit manner to a simple discrete Kirchhoff form.
    Additional Material: 6 Ill.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/nme.1620371505
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