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  • 25.70.Lm  (2)
  • Electron determination of structures  (2)
  • 1
    Electronic Resource
    Electronic Resource
    Springer
    Il nuovo cimento della Società Italiana di Fisica 11 (1989), S. 1145-1163 
    ISSN: 0392-6737
    Keywords: Electron determination of structures
    Source: Springer Online Journal Archives 1860-2000
    Topics: Physics
    Description / Table of Contents: Riassunto È stato effettuato uno studio dettagliato delle modificazioni strutturali presenti in monocristalli di GaS e GaSe, utilizzando la tecnica della diffrazione elettronica a fasci convergenti. Sono stati analizzati cristalli cresciuti sia dal fuso con il metodo Bridgman-Stockbarger, sia da fase vapore per trasporto chimico assistito da iodio. I risultati delle osservazioni hanno mostrato che la struttura del GaSe dipende fortemente dal metodo di crescita, mentre questo non si verifica per il GaS. Infatti, i cristalli cresciuti dal fuso, sia di GaS che di GaSe, sono costituiti solo dal politipo esagonale β con gruppo spazialeP63/mmc, la cui presenza è stata confermata dall'osservazione del centro di simmetria caratteristico di tale struttura. I cristalli di GaS cresciuti da fase vapore sono costituiti dal politipo esagonale β, mentre queli di GaSe sono costituiti dalla sovrapposizione del politipo esagonale ε, avente gruppo spaziale $$P\bar 62m$$ , e dal politipo romboedrico γ con gruppo spazialeR3m.
    Abstract: Резюме Проводится подробное исследовние структурных изменений в кристаллах GaS и GaSe, используя метод дифракции сходящегося электронного пучка. Проведен анализ некоторых монокристаллов, выращенных из расплава, с номощью метода Бридгмана-Стокбаргера, из паровой фазы и с помощью химического метода переноса. Результаты наблпюдений с помощью электронной микрокопии показывают, что структура GaSe сильно зависит от метода выращивания. В кристаллах, выращенных из расплава, наблюдается только гексагональная β структура для GaS и для GaSe. Кристаллы, выращенные из паровой фазы, обнаруживают β структуру для GaS и суперпозицию гексагонального ε политипа и ромбоэдрического γ политипа для образцов GaSe. Для всех рассмотренных кристаллов проведена аккуратная оценка параметров решетки.
    Notes: Summary A detailed study of the structural modifications present in GaS and GaSe crystals has been performed by means of the convergent-beam electron diffraction technique. Several single crystals have been analysed, as grown both from the melt, by the Bridgmann-Stockbarger method, and from the vapour, by the iodine-assisted chemical transport method. The results of the electron microscopy observation show the structure of GaSe to be strongly dependent on the growth method. In the melt-grown crystals only the hexagonal β structure (space groupP63/mmc) has been observed for both GaS and GaSe. It has been confirmed by the related symmetry centre, evidenced in particular low symmetry orientation of the samples. The vapour-grown crystals show the same β structure for GaS and the superposition of the hexagonal ε polytype (space group $$P\bar 62m$$ ) and the rhombohedral γ polytype (space groupR3m) for GaSe samples. An accurate evaluation of the lattice parameters has been performed for all the analysed crystals.
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  • 2
    Electronic Resource
    Electronic Resource
    Springer
    Il nuovo cimento della Società Italiana di Fisica 7 (1986), S. 795-806 
    ISSN: 0392-6737
    Keywords: Electron determination of structures
    Source: Springer Online Journal Archives 1860-2000
    Topics: Physics
    Description / Table of Contents: Riassunto È stata effettuata la diffrazione elettronica su cristalli di seleniuro di indio, clivati da lingotti cresciuti col metodo di Bridgman-Stoekbarger parterdo dagli elementi puri, presi sia in rapporto stechiometrico che in rapporti diversi. L’analisi delle figure di diffrazione ottenute in area selezionata ha permesso d’individuare la presenza di due politipi, i cui parametri reticolari sono stati calcolati. L’impilamento dei due politipi è stato osservato mediante le frange moiré.
    Abstract: Резюме Исследуется дифракция электронов на тонких кристалах InSe, выращенных из стехиометрического и нестехионетрического расплавов, с помощью метода Бридгмана-Стокбаргера. Анализ дифракдионных картин обнаруживаеет наличне двух фаз, для которых вычисляются параметры решетки. С помощью наблюдения муаровых полос исследуется поспедовательность группирования политипов.
    Notes: Summary Electron diffraction has been performed on thin crystals of indium selenide, cleaved from ingots grown from stoichiometric and nonstoichiometric melt by the Bridgman-Stockbarger method. The analysis of the selected area diffraction patterns has shown the presence of two phases, whose lattice parameters have been calculated. The stacking sequence of the polytypes has been observed through the moiré patterns.
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  • 3
    ISSN: 1434-601X
    Keywords: 25.70.Lm
    Source: Springer Online Journal Archives 1860-2000
    Topics: Physics
    Notes: Abstract The reactions induced by 143 MeV32S on58Ni have been studied detecting discrete γ-rays in coincidence with projectile-like fragments (PLF). Information on PLF excitation probability and sequential decay of target-like fragments (TLF) has been obtained. For the28Si+62Zn outgoing channel at small energy loss (¦Q¦〈20 MeV), both PLF and TLF data indicate that thermal equilibrium is not attained. The hypothesis of an equal excitation energy partition between the two reaction fragments does not describe properly experimental TLF data. A dependence of PLF excitation probability on the outgoing channel is found for the two final channels32S+58Ni and28Si+62Zn. The values of the spin alignment parameterP zz, derived for PLF and TLF from measurements ofγ-rays anisotropy, are in disagreement with the expectations of the transport theory for dissipative collisions.
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  • 4
    ISSN: 1434-601X
    Keywords: 25.70.Lm
    Source: Springer Online Journal Archives 1860-2000
    Topics: Physics
    Notes: Abstract The deep-inelastic reaction induced by 143 MeV32S on58Ni have been studied detecting projectile-like fragments (PLF) in coincidence withγ-rays in NaI(TI) scintillators. γ-ray multiplicity and anisotropy have been derived for Zplf=14, 15 as a function of energy loss and/or γ-energy. The information obtained are compared with a discrete γ-line study of the same reaction. The effect of the exit channel selection (ejectileZ, energy loss,E γ) on the γ-observables is discussed in connection with the evidence of a strong PLF γ-emission.
    Type of Medium: Electronic Resource
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