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Designing Test Chips for Custom Integrated Circuits (1985)

Timoc, C. C. ; Griswold, T. W. ; Buehler, M. G. ; [et al.]

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Publication Date: 2019-06-28

Description: Collection of design and testing procedures partly automates development of built-in test chips for CMOS integrated circuits. Testchip methodology intended especially for users of custom integratedcircuit wafers. Test-Chip Designs and Testing Procedures (including datareduction procedures) generated automatically by computer from programed design and testing rules and from information supplied by user.

Keywords: ELECTRONIC SYSTEMS

Type: NPO-15988 , NASA Tech Briefs (ISSN 0145-319X); 9; 1; P. 64

Format: text

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