ISSN:
0049-8246
Keywords:
Chemistry
;
Analytical Chemistry and Spectroscopy
Source:
Wiley InterScience Backfile Collection 1832-2000
Topics:
Physics
Notes:
A method for the determination of the mean size of submicron particles randomly distributed in a matrix by electron probe x-ray microanalysis (EPMA) is described. The method is based on an analysis of variance of the characteristic x-ray intensity from an element contained only in the particle. Analytical expressions relating this variance to the mean size of the particles were derived and the method was validated using test samples. The present technique can be used with a conventional x-ray microanalyser for the rapid determination of the mean size of submicron particles.
Additional Material:
5 Ill.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1002/xrs.1300240105
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