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  • 71.45Gm  (1)
  • Electron microscopy determinations (including scanning tunneling electron microscopy methods)  (1)
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  • 1
    Electronic Resource
    Electronic Resource
    Springer
    Il nuovo cimento della Società Italiana di Fisica 15 (1993), S. 451-457 
    ISSN: 0392-6737
    Keywords: Electron microscopy determinations (including scanning tunneling electron microscopy methods) ; Other topics in nonelectronic transport properties ; Geometry ; atomic and molecular orientation ; crystal shapes ; surface topography
    Source: Springer Online Journal Archives 1860-2000
    Topics: Physics
    Notes: Summary The transport and switch of Xe atoms on the Ni-W interface of a scanning tunnelling microscope have been analysed for different geometries as a function of the tip position with respect to the Ni(110) surface. Our results show that the control of the different experimental results can only be achieved by a precise control of the position of the tip on the sample. In particular, the tip-sample Xe switch can only be obtained within tip heights of 0.2Å.
    Type of Medium: Electronic Resource
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  • 2
    Electronic Resource
    Electronic Resource
    Springer
    Applied physics 54 (1992), S. 132-138 
    ISSN: 1432-0630
    Keywords: 72.20Ht ; 71.45Gm
    Source: Springer Online Journal Archives 1860-2000
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics , Physics
    Notes: Abstract The formation of a wake field around a swift ion passing through an electron gas and the resulting contribution to the stopping power acting on the ion is an intensively studied phenomenon in metals and semiconductors. The present investigation serves to clarify whether an analogous effect, namely the formation of wake fields and a corresponding contribution to the resistivity, might occur in the Galilei-transformed case of electronic transport in doped semiconductors where the gas of drifting charge carriers passes through an array of fixed impurity ions. By use of an appropriate dynamical screening theory we show that indeed a local plateau in the current density versus field characteristic has to be expected whenever the mean drift energy per carrier exceeds the sum of the mean thermal carrier energy and the zero-point energy of the longitudinal plasma mode of the carrier gas. However, our survey of the published literature suggests that this condition might be too stringent, at least for bulk materials and standard experimental situations, where the strong carrier heating in the high-field regime of relevance in combination with other drift-limiting mechanisms or interband electron-hole avalanching would always precede and prevent the formation of the wake.
    Type of Medium: Electronic Resource
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