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  • 1
    ISSN: 1090-6487
    Keywords: 72.20.E ; 72.80.Jc
    Source: Springer Online Journal Archives 1860-2000
    Topics: Physics
    Notes: Abstract The hopping conductivity σ3 has been studied in samples of slightly counterdoped crystalline Si: B with a boron concentration of 2×1016 cm−3〈N〈1017 cm−3 and a compensation of 10−4≤K≤10−2. It is found that at K≤10−3 the activation energy ε3 is not lower (as it must be according to classical notions at finite K) but larger than the value εN=e 2 N 1/3/κ, where e is the electronic charge and κ is the dielectric constant. With decreasing N, the energy ε3 drops slower and, with decreasing K, grows faster than follows from the standard theory. At K≤10−4, ε3 is higher than ε N by a factor of 1.5–2. The result is explained by the effect of the overlap between wave functions of neighboring impurity centers on the structure of the impurity band.
    Type of Medium: Electronic Resource
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  • 2
    Electronic Resource
    Electronic Resource
    Springer
    JETP letters 66 (1997), S. 249-254 
    ISSN: 1090-6487
    Keywords: 61.72.Tt ; 72.40.+w
    Source: Springer Online Journal Archives 1860-2000
    Topics: Physics
    Notes: Abstract The static conductivity σ(E) and photoconductivity (PC) at radiation frequencies ħω=10 and 15 meV in Si doped with shallow impurities (density N=1016−6×1016 cm−3, ionization energy ε1≃45 meV) with compensation K=10−4−10−5 in electric fields E=10–250 V/cm are measured at liquid-helium temperatures T. Special measures are taken to prevent the high-frequency part of the background radiation (ħω〉16 meV) from striking the sample. It is found that the conductivity σ(E) is due to carrier motion along the D − band, which is filled with carriers under the influence of the field E. In fields E〈E q (E q ≃100–200 V/cm) the carrier motion consists of hops along localized D − states in a 10–15 meV energy band below the bottom of the free band (energy ε=ε1); for E〉E q carriers drift along localized D − states with energy ε∞ε1−10 meV. An explanation is proposed for the threshold behavior of the field dependence of the photo-and static conductivities.
    Type of Medium: Electronic Resource
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