Publication Date:
2014-03-15
Description:
Author(s): R. T. Zhang, X. Ma, S. F. Zhang, X. L. Zhu, W. T. Feng, D. L. Guo, Y. Gao, B. Li, D. B. Qian, H. P. Liu, S. Yan, and P. Zhang Electron emissions are studied for the double-electron capture with simultaneous single ionization process in 30 keV/u He2+-Ar atom collision using the reaction microscope technique. Double-differential cross sections have been obtained for emission angles of 0°, 20°, 45°, 90°, 128°, and 175° and el... [Phys. Rev. A 89, 032708] Published Fri Mar 14, 2014
Keywords:
Atomic and molecular collisions and interactions
Print ISSN:
1050-2947
Electronic ISSN:
1094-1622
Topics:
Physics
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