Electron emission in double-electron capture with simultaneous single ionization in 30-keV/u He2+4-Ar collisions

R. T. Zhang, X. Ma, S. F. Zhang, X. L. Zhu, W. T. Feng, D. L. Guo, Y. Gao, B. Li, D. B. Qian, H. P. Liu, S. Yan, and P. Zhang
Phys. Rev. A 89, 032708 – Published 14 March 2014

Abstract

Electron emissions are studied for the double-electron capture with simultaneous single ionization process in 30 keV/u He2+-Ar atom collision using the reaction microscope technique. Double-differential cross sections have been obtained for emission angles of 0°, 20°, 45°, 90°, 128°, and 175° and electron energies ranging from 0 to 80 eV. No cusp-shaped electrons centered at a speed equal to that of the incident projectile in the forward direction are observed, which is contrary to the earlier results [D. Fregenal, J. Fiol, G. Bernardi, S. Suarez, P. Focke, A. D. Gonzalez, A. Muthig, T. Jalowy, K. O. Groeneveld, and H. Luna, Phys. Rev. A 62, 012703 (2000)]. An explanation has been provided to clarify the observed results in the current reaction channel.

  • Figure
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  • Received 3 November 2013
  • Revised 16 January 2014

DOI:https://doi.org/10.1103/PhysRevA.89.032708

©2014 American Physical Society

Authors & Affiliations

R. T. Zhang1,*, X. Ma1,†, S. F. Zhang1, X. L. Zhu1, W. T. Feng1, D. L. Guo1,2, Y. Gao1,2, B. Li1, D. B. Qian1, H. P. Liu1, S. Yan1, and P. Zhang1

  • 1Institute of Modern Physics, Chinese Academy of Sciences, Lanzhou 730000, China
  • 2University of Chinese Academy of Sciences, Beijing 100049, China

  • *r.zhang@gsi.de; present address: ExtreMe Matter Institute EMMI and Research Division, GSI Helmholtzzentrum für Schwerionenforschung, Planckstraße 1, 64291 Darmstadt, Germany and FIAS Frankfurt Institute for Advanced Studies, 60438 Frankfurt am Main, Germany.
  • Corresponding author: x.ma@impcas.ac.cn

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Vol. 89, Iss. 3 — March 2014

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