Electronic Resource
Woodbury, NY
:
American Institute of Physics (AIP)
Applied Physics Letters
63 (1993), S. 2195-2197
ISSN:
1077-3118
Source:
AIP Digital Archive
Topics:
Physics
Notes:
The structure of Nb thin films grown by molecular beam epitaxy on sapphire has been studied using high-resolution x-ray scattering techniques. Transverse scans of the x-ray wave vector transfer through the (110)Nb Bragg peak show diffuse scattering with a Lorentzian-squared profile, and satellite Bragg peaks for certain orientations of the crystal. The former feature arises from a random, two-dimensional network of Nb domains, and the latter from a periodic distortion of the Nb films at the terrace edges of the vicinal sapphire substrate.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.110551
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