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  • 1
    Electronic Resource
    Electronic Resource
    Subpicosecond KrF*-laser plasma interaction at intensities between 1014 and 1017 W/cm2 (1996)
    [S.l.] : American Institute of Physics (AIP)
    Physics of Plasmas 3 (1996), S. 2679-2685 
    Details
    ISSN: 1089-7674
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The interaction of high-intensity subpicosecond KrF*-laser pulses with aluminium plasmas is investigated at intensities between 1014 and 1017 W/cm2. Using a one-dimensional hydrocode, the laser energy absorption and time evolution of plasma parameters have been studied as a function of laser intensity, incidence angle, and polarization. Complementary particle-in-cell simulations have also been performed to check the collisionless absorption component carried by hot electrons and ions. These simulations are compared to previous experiments on laser pulse absorption and x-ray generation. © 1996 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.871525
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  • 2
    Electronic Resource
    Electronic Resource
    X-ray spectra from high-intensity subpicosecond laser produced plasmas (1995)
    [S.l.] : American Institute of Physics (AIP)
    Physics of Plasmas 2 (1995), S. 972-981 
    Details
    ISSN: 1089-7674
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The interaction of high-intensity subpicosecond KrF*-laser pulses with aluminum plasmas has been investigated. The laser pulse absorption and the x-ray production have been related at a series of intensities up to 1017 W/cm2 and different angles of incidence. Soft x-ray spectra were measured in the wavelength range from 7 to 150 A(ring) with various spectrographs. The spectra show distinct dependences on the laser intensity, the polarization, and the angle of incidence. The observed dependence of the spectra on the intensity and on the angle of incidence is the result of both the angular dependence of the laser pulse absorption and that of the conversion efficiency of the absorbed energy into soft x-ray emission. The spectra are influenced by the size of the absorption volume, the electron density where the absorption mainly takes place, and other parameters, such as the electron temperature. © 1995 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.871481
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  • 3
    Electronic Resource
    Electronic Resource
    Monochromatic focusing of subpicosecond x-ray pulses in the keV range (1999)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 70 (1999), S. 1288-1299 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: An effective x-ray optical method to focus keV x-ray pulses shorter than one picosecond by using spherically or toroidally bent crystals is presented. The spectral, spatial, and time-dependent properties of focusing by two-dimensional bent crystals are calculated by considering geometrical effects, physical limitation in high performance crystal optics, and reflectivities obtained by x-ray diffraction theory. These properties are compared with first experimental results of focusing x rays from a plasma created by a laser pulse with 4.5 mJ energy and 100 fs pulse length. The x-ray signals, simultaneously obtained from a von Hámos spectrometer and two-dimensional bent crystals are compared and found in good agreement with theoretical data. The possibilities and aspects of laser pump x-ray probe experiments using this type of x-ray optics system and currently available laser systems are discussed. © 1999 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1149587
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  • 4
    Electronic Resource
    Electronic Resource
    A quartz quasimonolith for absolute x-ray wavelength measurements (1997)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 68 (1997), S. 3669-3675 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: We have constructed a quasimonolithic crystal consisting of two offset, parallel-mounted quartz (101¯0) crystals for determining the wavelengths of x-ray transitions on an absolute scale without the need for reference lines. The design and organization of the quasimonolith crystal device, as well as the determination of the relevant parameters and their corresponding uncertainties are discussed. A calibration chain is established that enables linking any wavelength measurement directly to optical wavelength standards and thus to SI units. Our analysis shows that absolute wavelength measurements with an uncertainty of one part per million are in principle possible with the device. Implementation of the quartz quasimonolith in a high-resolution vacuum spectrometer used to study x-ray line emission from an electron beam ion trap is described. © 1997 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1148010
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  • 5
    Electronic Resource
    Electronic Resource
    Vertical dispersion mode double-crystal spectrometer for advanced spectroscopy of laser-produced plasma (1995)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 66 (1995), S. 3234-3243 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: A vertical dispersion variant of the double-crystal spectrometer (DCV), which has been successfully used to study radiative transport in plasmas with large velocity gradients, is described. The full theory of the instrument is presented with particular reference to distortion of the spectral lines observed. The main characteristics of the DCV were computed by ray tracing procedures and compared with experiment. Due to its extremely high dispersion, the DCV minimizes geometric apparatus smearing, the distortion of the spectra is negligible a high spectral resolution (typically several thousand or better) can be achieved at relatively small source-to-detector distances. The instrument provides two sets of spectra with one-dimensional spatial resolution at the level of 10 μm, and its sensitivity to relative positions and shifts of the spectral lines may be estimated as one part in 105. The very high precision in wavelength determination, both absolute and relative, combined with an acceptable luminosity make this spectrometer especially useful for ultrahigh-resolution spectroscopy of laser-produced plasmas. © 1995 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1145488
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  • 6
    Electronic Resource
    Electronic Resource
    Double-crystal high-resolution x-ray spectroscopy of laser-produced plasmas (1993)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 64 (1993), S. 26-30 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: A double-crystal x-ray spectrometer (DCS) has been used to obtain high-resolution x-ray spectra of laser-produced plasmas. The DCS has a high dispersion, and thus can obtain highly resolved spectra in circumstances where the resolution of a conventional single-crystal Bragg spectrometer at comparable source-to-detector distances would be limited by the source size. In addition the DCS also yields unit-magnification one-dimensional spatial resolution in the direction perpendicular to the spectral direction. The instrument produces two spectra symmetrically disposed about a central wavelength, which makes it especially useful for measuring spectral line shifts. Analysis of the spectra from hydrogenic aluminium and helium-like chlorine indicates a resolving power (λ/Δλ) greater than 2500 and a spatial resolution better than 30 μm.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1144397
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  • 7
    Electronic Resource
    Electronic Resource
    X-ray focusing optics using flat or bent crystals with two-dimensionally modulated surfaces (1995)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 78 (1995), S. 4823-4829 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Calculations of focus characteristics for x-ray focusing systems using either flat or bent crystals with two-dimensional modulated surfaces are presented. Based on the wave-optics approach, the analytical formulas are derived for elliptical Fresnel zone structures (flat crystals) and linear Bragg zone structures (toroidally bent crystals). It is shown that for a given Si(111) reflection and Ti Kα radiation, a micron-size focal spot can be achieved by using only one flat crystal with a modulated surface. The peak intensity is then nearly 100 times higher than that of the flat crystal without modulations. However, for a toroidally bent crystal with both Fresnel and Bragg diffraction amplitudes, the latter becomes dominant, since, due to the bending, the rapid oscillations of the Fresnel diffraction amplitude vanish. It is also shown that a focal spot of 0.3 μm for a bent crystal with linear Bragg zone structures is approximately four times narrower than that of an unmodulated surface. From the analysis, the modulated surfaces for cylindrically and spherically bent crystals are deduced to be a combination of Bragg and Fresnel zones. © 1995 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.360741
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  • 8
    Electronic Resource
    Electronic Resource
    X-ray focusing optics. I. Applications of wave optics to doubly curved crystals with a point x-ray source (1995)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 77 (1995), S. 1843-1848 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: A wave optics approach to the calculations of the intensity distribution of an x-ray point source image with a two-dimensional (2D) focusing geometry is presented. Analytical formulas are derived to calculate the intensity distribution at the focal plane. This approach has taken into account the effects of x-ray scattering within a 2D bent crystal, which includes the x-ray refraction and absorption inside the crystal, and the effects of elastically deformed crystals described by the anisotropic elasticity theory. Based upon the elastic bending model, the modified Bragg law and 2D lens equations are discussed. In addition, the x-ray extinction distance for curved crystals is found to be dependent on the size and the bending radius of bent crystals. For a monochromatic x-ray point source, calculation of the intensity distribution with a 2D bent silicon crystal is given for both perfect and misaligned sources. The spatial resolution and the size of the image are determined. © 1995 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.358883
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  • 9
    Electronic Resource
    Electronic Resource
    X-ray focusing optics. II. Properties of doubly bent crystals with an extended x-ray source (1995)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 77 (1995), S. 1849-1854 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Calculations and analysis of an extended x-ray source image with a 2D focusing geometry are presented. Based upon the calculations for an x-ray point source image (Paper Ia), theoretical expressions are derived which reveal the contributions from both the Bragg and the optical (Fresnel) diffractions to the intensity distribution of the image at the focal plane. That is, for a given focusing geometry, the intensity distribution of the image of an extended source consists not only of the crystal rocking curves for a bent crystal, due to the Bragg diffraction; but also of the optical diffraction, the Fresnel integral, due to the phase correlations of the thickness and the spatial extent of a doubly bent crystal. The contribution from the optical diffraction depends solely upon the bent crystal focusing geometry. The relationship between the source and the image at the focal plane is obtained, and the intensity distribution of an extended x-ray source image with a 2D bent silicon crystal is given. © 1995 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.358884
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  • 10
    Electronic Resource
    Electronic Resource
    Coronary angiography using laser plasma sources: X-ray source efficiency and optimization of a bent crystal monochromator (2001)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 90 (2001), S. 3048-3056 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: A monochromator has been developed for coronary angiography, comprising a single bent crystal of silicon in Laue transmission geometry. K spectra of laser irradiated solid tin and tantalum (Z=50 and 73, respectively) targets were measured. The high resolution crystal spectrometer resolve the Sn and Ta Kα doublets, allowing in a proof-of-principle experiment the absolute Kα photon numbers emitted by the source to be determined. The Ta Kα yield is measured as a function of the laser pulse energy, allowing an assessment to be made of the suitability of such sources for medical applications. © 2001 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1394904
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