ISSN:
1089-7550
Source:
AIP Digital Archive
Topics:
Physics
Notes:
Ti and N were implanted into soda lime glass to doses up to 4.5×1017 cm−2 to reduce solar load and infrared transmission. Analysis of the Ti+N implant distributions by Rutherford backscattering spectrometry and x-ray photoelectron spectroscopy (XPS) revealed profiles which closely followed each other as designed by the selection of implant energies. XPS, x-ray diffraction, and selected area electron diffraction in transmission electron microscopy also confirmed the existence of a crystalline B1-type, cubic TiN layer, 140 nm wide, at doses greater than 9×1016 cm−2. Optical measurements showed that the fraction of infrared radiation reflected was increased by almost a factor of 4 compared to an increase of 1.8 in the visible region. The percentage of the total solar energy rejected reached 80% at the highest dose, indicating that the buried TiN layer is highly effective in reducing solar energy transmission. © 1996 American Institute of Physics.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.363194
Permalink
