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A calibration method of a radio frequency magnetic probe (1999)

Yang, J. G. ; Choi, J. H. ; Kim, B. C. ; [weitere]

[S.l.] : American Institute of Physics (AIP)

Review of Scientific Instruments 70 (1999), S. 3774-3775

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ISSN: 1089-7623

Quelle: AIP Digital Archive

Thema: Physik , Elektrotechnik, Elektronik, Nachrichtentechnik

Notizen: We demonstrate a simple calibration method of a rf magnetic probe by utilizing a two port network analysis method. The sensitivity (V/G) of the probe is determined by measuring the scattering parameters of S11 and S21. The magnetic field generated by the Helmholtz coil is calculated from S11 and the probe sensitivity is obtained from S21. The measured probe sensitivity is 0.1–0.6 V/G in the frequency range of 1–15 MHz. © 1999 American Institute of Physics.

Materialart: Digitale Medien

URL: http://dx.doi.org/10.1063/1.1149951

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Digitale Medien

Elliptical grain growth in the solid-phase crystallization of amorphous SrBi2Ta2O9 thin films (1999)

Choi, J. H. ; Lee, J. Y.

Woodbury, NY : American Institute of Physics (AIP)

Applied Physics Letters 74 (1999), S. 2933-2935

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ISSN: 1077-3118

Quelle: AIP Digital Archive

Thema: Physik

Notizen: During the crystallization process of amorphous SrBi2Ta2O9 (SBT) thin films at 800 °C in a dry O2 ambient, we have found elliptical nuclei in the initial nucleation state. These elliptical grains are preferentially oriented to [110] direction in the [11¯0] direction of projection. Elliptical grain growth keeps [110] as increasing the annealing time at 800 °C. Transmission electron microscopy and selected-area electron diffraction pattern indicate that the origin of 〈110〉-oriented crystallization is due to the highest ionic packing (001) SBT plane which includes TaO6 octahedra and the nearest bonding direction of TaO6 octahedra in SBT plane is the 〈110〉 direction. © 1999 American Institute of Physics.

Materialart: Digitale Medien

URL: http://dx.doi.org/10.1063/1.123970

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