ISSN:
1089-7550
Source:
AIP Digital Archive
Topics:
Physics
Notes:
La1−xSrxMnO3 films about 4000 A(ring) thick were deposited on thermally oxidized Si wafers, and then their crystalline orientation and magnetic characteristics were investigated. Orientation of (111) in which large ions such as O2−, La3+, and Sr2+ are most closely packed became preferential with increase of total gas pressure Ptotal and partial oxygen pressure PO2. Although spontaneous magnetization was not detected, even the film deposited at substrate temperature Ts as low as 330 °C revealed obvious orientation of (110) in which metallic ions are most closely packed. The film deposited at Ts of 500 °C, Ptotal of 2.0, and PO2 of 0.1 mTorr, and the film postannealed at 900 °C for 3 h in oxygen atmosphere possessed the saturation magnetization 4πMs of 1.2 and 3.5 kG at 77 K and their Curie temperatures were 217 and 313 K, respectively. B–H curves at 77 K revealed that the easy magnetization direction of these films was in-plane. © 1996 American Institute of Physics.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.361300
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