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  • 2000-2004  (104)
  • 1930-1934  (2)
  • 1905-1909  (1)
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  • 1
    Call number: PIK O 080-02-0053
    Type of Medium: Monograph available for loan
    Pages: 113 p.
    ISBN: 9289013559
    Series Statement: European Series 88
    Location: A 18 - must be ordered
    Branch Library: PIK Library
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  • 2
    Monograph available for loan
    Monograph available for loan
    Cambridge UNiversity Press : Cambridge [u.a.]
    Call number: PIK N 076-02-0346
    Type of Medium: Monograph available for loan
    Pages: 338 p.
    Edition: 1. ed.
    ISBN: 0521782368
    Location: A 18 - must be ordered
    Branch Library: PIK Library
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  • 3
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 89 (2001), S. 5209-5214 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Grazing incidence x-ray reflectometry has been used to study surface oxidation as a diffusion barrier for Al deposited on ferromagnetic metals (Co, Fe, Ni, and Ni80Fe20). Samples of the form SiO2(backward-slash)10 nm X(backward-slash)4 nm Al with X=(Co, Fe, Ni, and Ni80Fe20) were investigated for X(backward-slash)Al intermixing. Surface oxidation was achieved by exposing the ferromagnetic layer to O2 to oxidize the top two or three atomic layers before depositing the Al layer. Specular x-ray scans were used for the analysis. Samples of the form SiO2(backward-slash)10 nm X(backward-slash)4 nm Au were used to separate topographical roughness from intermixing. Surface oxidation was found to suppress the diffusion of Al into Co, Ni, and Ni80Fe20 but not into Fe. © 2001 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 4
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 88 (2000), S. 5501-5501 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Type of Medium: Electronic Resource
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  • 5
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 89 (2001), S. 7603-7605 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: We report results for μMAG standard problem No. 4, a 500 nm×125 nm×3 nm rectangle of material with properties to mimic Permalloy. Switching dynamics are calculated for fields applied instantaneously to an initial s state: Field 1 at 170° and Field 2 at 190° (−170°) from the positive long axis. Reversal in Field 1 proceeds by propagation of end domains toward the sample center. Reversal in Field 2 involves rotation of the end domains in one direction while the center of the particle rotates in the opposite direction, resulting in collapsing 360° walls with complex dynamics on fine length scales. Approaching the static coercivity, Hc, in small field steps, we find that the ring down frequency, f, and susceptibility, χ, are in approximate agreement with a single spin model that predicts f∝(Hc−H)1/4 and χ∝(Hc−H)−1/2. We show a correlation between the modes of oscillation that become unstable at the critical field and the switching behavior. © 2001 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 6
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 88 (2000), S. 3561-3564 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Anisotropy fields in excess of 120 kA/m (1500 Oe) have been produced in 3–5-nm-thick polycrystalline films of Co by oblique sputtering of Ta underlayers. The unusually high anisotropy is magnetostatic in origin and is induced by corrugations on the surface of an obliquely sputtered Ta underlayer. Cross-sectional transmission electron microscopy reveals 4 nm columnar grains of Ta tilted toward the Ta source and elongated perpendicular to the Ta flux in the film plane. The anisotropy field of the Co film increases with both the underlayer thickness and the angle between the Ta source and the film normal. In spin valve samples, the anisotropy is attenuated by more than an order of magnitude across a 4-nm-thick Cu spacer. Magnetoresistance measurements on a spin valve indicate less than 2° dispersion in hard axis directions, and despite the nanometer-scale roughness of the underlayer there is weak broadening of the ferromagnetic resonance line. © 2000 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 7
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 87 (2000), S. 5520-5522 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: For a uniformly magnetized rectangular particle with dimensions in the ratio 5 : 1 : 0.1, the coercive and switching fields in the (1,1,1) direction are determined to be Hc/Ms=0.057069478 and Hs/Ms=0.057142805. Previous micromagnetic computations of coercive and switching fields that did not approach these values for small particles are analyzed. It is shown that the disagreement was primarily due to a disparity in the method of calculating demagnetization energy. Corrected simulations are shown to agree with analytically determined values. © 2000 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 8
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 87 (2000), S. 5992-5994 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The preparation and measurement of nickel spheres for use in the calibration of magnetometers are described. The absolute value of the magnetic moment of a set of these spheres near room temperature was measured using the Faraday method. The variations of moment for temperatures near room temperature and for applied fields between 0.3 and 5 T were also determined.
    Type of Medium: Electronic Resource
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  • 9
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 89 (2001), S. 6825-6827 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: It has recently been found that large uniaxial anisotropy fields in excess of 120 kA/m (1500 Oe) can be created in thin (3–5 nm) films of Co by obliquely sputtered Ta underlayers. This anisotropy can be used to pin the bottom film of a spin valve while having only a modest effect on the top "free" film, separated by a 2.5 nm Cu spacer layer. This article describes measurements of thermal stability in these Ta-pinned spin valves. Using room temperature giant magnetoresistance (GMR) as a measure, we find that the structure is stable under cumulative 20 min anneals at 25 °C intervals up to 300 °C; GMR decreases to zero upon further anneals up to 450 °C. Measurements taken at elevated temperatures reveal that GMR decreases linearly with temperature, extrapolating to zero at approximately 425 °C, while the anisotropy field is much less temperature dependent, remaining nearly constant up to 150 °C and gradually decreasing to 50% of its room temperature value at 325 °C. © 2001 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 10
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 88 (2000), S. 5296-5299 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Anisotropy fields in excess of 120 kA/m (1500 Oe) have been produced in 3–5-nm-thick polycrystalline films of Co by oblique sputtering of Ta underlayers. The unusually high anisotropy is magnetostatic in origin and is induced by corrugations on the surface of an obliquely sputtered Ta underlayer. Cross-sectional transmission electron microscopy reveals 4 nm columnar grains of Ta tilted toward the Ta source and elongated perpendicular to the Ta flux in the film plane. The anisotropy field of the Co film increases with both the underlayer thickness and the angle between the Ta source and the film normal. In spin valve samples, the anisotropy is attenuated by more than an order of magnitude across a 4-nm-thick Cu spacer. Magnetoresistance measurements on a spin valve indicate less than 2° dispersion in hard axis directions, and despite the nanometer-scale roughness of the underlayer there is weak broadening of the ferromagnetic resonance line. © 2000 American Institute of Physics.
    Type of Medium: Electronic Resource
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