ISSN:
1435-1536
Keywords:
Polypropylene
;
x-ray scattering
;
line porfile analysis
;
paracrystal
;
Ziegler-Natta catalyst
Source:
Springer Online Journal Archives 1860-2000
Topics:
Chemistry and Pharmacology
,
Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
Notes:
Abstract The line profile analysis of high-resolution wide angle X-ray diffraction spectra (WAXS) has been employed to characterize two polypropylenes polymerized by: a) “conventional” Ziegler-Natta catalyst (PP-A) and b) “high-yield” new supported catalyst (PP-B). The observed differences in line-width are most reasonably due to a marked crystallite size anisotropy, more pronounced for PP-A. The smallest size is along the crystallographic a-axis, which is the preferred direction of growth of crystallites. Paracrystalline fluctuations, on the whole larger in the high-yield polymer than in the conventional one, are present. The diffuse background resulting from line profile analysis is preliminarily investigated here in terms of scattering from a microcrystalline array.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1007/BF01452219
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