Electronic Resource
[S.l.]
:
American Institute of Physics (AIP)
Review of Scientific Instruments
59 (1988), S. 537-540
ISSN:
1089-7623
Source:
AIP Digital Archive
Topics:
Physics
,
Electrical Engineering, Measurement and Control Technology
Notes:
A new scanning tunneling microscope (STM) system is described that has been operated in several environments for both topographic imaging and tunnel spectroscopy. This STM shows high resistance to the effects of vibration and thermal drift. The device is unique in its simplicity and has only four moving parts. In addition, the critical tip–sample approach mechanism is inherently reliable and precise. The STM system accommodates a wide range of sample geometries and requires no special sample holder.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.1139882
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