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  • 1
    Electronic Resource
    Electronic Resource
    Parallel Beam Powder Diffractometry Using Synchrotron Radiation (1986)
    s.l. ; Stafa-Zurich, Switzerland
    Materials science forum Vol. 9 (Jan. 1986), p. 39-46 
    Details
    ISSN: 1662-9752
    Source: Scientific.Net: Materials Science & Technology / Trans Tech Publications Archiv 1984-2008
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
    Type of Medium: Electronic Resource
    URL: http://www.tib-hannover.de/fulltexts/2011/0528/02/21/transtech_doi~10.4028%252Fwww.scientific.net%252FMSF.9.39.pdf
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  • 2
    Electronic Resource
    Electronic Resource
    A new approach to the measurement of X-ray structure amplitudes determined by the Pendellösung method (1985)
    [S.l.] : International Union of Crystallography (IUCr)
    Acta crystallographica 41 (1985), S. 48-55 
    Details
    ISSN: 1600-5724
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Chemistry and Pharmacology , Geosciences , Physics
    Notes: The Laue-case rocking curve from two thin crystals is known to exhibit fine structure which can be used to determine the corresponding structure amplitude Fh. Thus F444 and F777 have been measured for crystalline silicon to a standard deviation of 0.2%. F444 is in excellent agreement with published experimental values. There are no previous high-precision measurements of F777 in the literature. The values measured seem to indicate that the accepted theoretical dispersion corrections are somewhat too low. A highly stable monolithic thin-wafer silicon dittractometer of a novel design was employed. Using an energy-dispersive solid-state detector and the white spectrum of a tungsten X-ray tube, rocking curves from a number of planes of the hhh family could be recorded simultaneously, thus reducing measurement time considerably and minimizing the influence of some sources of systematic and random error. Least-squares computer fitting of the theoretical curve to the complete measured one is employed to determine the value of Fh from the data. A complete discussion of the method is presented.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1107/S0108767385000083
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  • 3
    Electronic Resource
    Electronic Resource
    Direct measurements of the complex X-ray atomic scattering factors for elements by X-ray interferometry at the Daresbury Synchrotron Radiation Source (1986)
    [S.l.] : International Union of Crystallography (IUCr)
    Acta crystallographica 42 (1986), S. 456-464 
    Details
    ISSN: 1600-5724
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Chemistry and Pharmacology , Geosciences , Physics
    Notes: A scanning X-ray interferometer system [Hart & Siddons (1981). Proc. R. Soc. London Ser. A, 376, 465-482] has been rebuilt for operation at the SERC Daresbury Synchrotron Radiation Source (SRS). The SRS permits an increase in energy resolution by one decade and simultaneously an intensity gain of one thousand times, though in practice the solid-state detector employed limited the peak intensity utilized so that experiments which hitherto demanded one month of counting time are now performed at higher spectral resolution in 2-4 h. Absolute measurements are reported of f' and f” for the K edges of most elements between 34Se and 26Fe and for L edges of 79Au and 74W over energy ranges of about ± 2 keV near absorption edges and scans with better than 1 eV energy resolution of X-ray absorption near edge structure (XANES) and extended X-ray absorption fine structure (EXAFS) spectra near the edges. Over wide energy ranges the results are compared with the most recent calculations of Cromer & Liberman [Acta Cryst. (1981), A37, 267-268], which are now easily available to workers in the field.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1107/S0108767386098884
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  • 4
    Electronic Resource
    Electronic Resource
    Ytterbium LIII-edge anomalous scattering measured with synchrotron radiation powder diffraction (1987)
    [S.l.] : International Union of Crystallography (IUCr)
    Acta crystallographica 43 (1987), S. 677-683 
    Details
    ISSN: 1600-5724
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Chemistry and Pharmacology , Geosciences , Physics
    Notes: The use of synchrotron powder diffraction patterns to determine anomalous scattering contributions is described. The method is illustrated by the determination of f' of Yb at the Yb LIII absorption edge. Four data sets were collected with four wavelengths, fitted with Gaussian profiles and the integrated intensities used to determine by least-squares methods the crystal-structure parameters and the real part f' of the anomalous dispersion. The derived f' values had a precision of ± 0.2 electron units and averaged 32% higher than the Cromer-Liberman theoretical values.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1107/S010876738709874X
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  • 5
    Electronic Resource
    Electronic Resource
    The refractive-index correction in powder diffraction (1988)
    [S.l.] : International Union of Crystallography (IUCr)
    Acta crystallographica 44 (1988), S. 193-197 
    Details
    ISSN: 1600-5724
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Chemistry and Pharmacology , Geosciences , Physics
    Notes: Throughout the history of powder diffraction practice there has been uncertainty about whether or not a refractive-index correction should be made to Bragg's law. High-precision Bragg-angle measurements have been performed with synchrotron radiation on SRM- 640 silicon powders at glancing angles; it is found that little or no correction is necessary for the usual 2θ angle range.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1107/S010876738701050X
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  • 6
    Electronic Resource
    Electronic Resource
    Double-tilt wide-aperture two-crystal monochromator for x-ray absorption spectroscopy (abstract) : INTERNATIONAL CONFERENCE ON SYNCHROTRON RADIATION INSTRUMENTATION TSUKABA (JAPAN) 29 AUG−2 SEPT 1988 (1989)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 60 (1989), S. 2129-2129 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: A water-cooled double-crystal monochromator for x-ray absorption spectroscopy is described. It has a wide aperture (3 mrad) and is attached to a linear slide through a twin axis goniometer to a large Huber rotary table for accurate alignment of the crystal planes to the incident beam. The center of rotation of the goniometers has been chosen as the geometric center at the surface of the first crystal. The linear slide adjusts the monochromator vertically so that the axis of rotation intercepts the synchrotron radiation. The two goniometers provide the monochromator with a transverse and longitudinal tilt with respect to the x-ray beam. Water cooling is incorporated in the first crystal to dissipate the expected heat loading of 120 W from the SRS wiggler. The second crystal is supported by three Inchworms which control the yaw and tilt. Then adjustments are required to optimize spectral purity across the beam alignment and harmonic rejection, respectively, with respect to the first crystal. The performance of the monochromator is discussed.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1140849
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  • 7
    Electronic Resource
    Electronic Resource
    Line-broadening analysis of synchrotron x-ray diffraction data (1987)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 61 (1987), S. 2813-2816 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The advantages of using monochromatic and parallel synchrotron x rays for the microstructure analysis of polycrystalline materials have been studied. Analysis of line broadening from Pd powers showed encouraging results. Warren–Averbach analysis [J. Appl. Phys. 21, 595 (1950)] with respect to the three major crystal axes [111], [100], and [110] was done using 1-A(ring) x rays. Crystallite sizes and microstrains relative to the [111] direction were obtained using three different reflection pairs (111)-(222), (111)-(333), and (111)-(444). The fixed symmetrical instrument profile shape has major advantages in the correction of instrumental broadening and the determination of a low level (10−4 range) of stacking-fault probabilities.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.337872
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  • 8
    Electronic Resource
    Electronic Resource
    High-energy double-crystal X-ray diffraction (1988)
    Copenhagen : International Union of Crystallography (IUCr)
    Applied crystallography online 21 (1988), S. 516-520 
    Details
    ISSN: 1600-5767
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Geosciences , Physics
    Notes: High-energy double-crystal X-ray diffraction has previously only been demonstrated with radioactive sources. The advantages of very low absorption, no extinction and high resolution have been clearly demonstrated in a wide variety of experiments. The experiments reported here are the first to be performed with a high-energy X-ray tube providing radiation up to 160 keV. Mosaic spread has been studied by double-crystal rocking curves in silicon, germanium and calcium flouride in very thick samples. Mosaic spreads from 1′′ arc to several minutes of arc have been measured in 10 mm thick fluorite, in 25 mm thick germanium and in silicon. Routine non-destructive characterization of bulk crystalline materials is possible and many new opportunities will become available when high-energy storage rings make bright synchrotron radiation available in this part of the electromagnetic spectrum.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1107/S0021889888006120
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  • 9
    Electronic Resource
    Electronic Resource
    Crystal structures of quartz and magnesium germanate by profile analysis of synchrotron-radiation high-resolution powder data (1988)
    Copenhagen : International Union of Crystallography (IUCr)
    Applied crystallography online 21 (1988), S. 182-191 
    Details
    ISSN: 1600-5767
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Geosciences , Physics
    Notes: High-resolution synchrotron-radiation powder data for quartz and Mg2GeO4, an olivine homologue, were obtained with a 365 mm long parallel-slit collimator with 0.05° aperture. The crystal structures were refined using a pseudo-Voigt profile fitting function and POWLS. Fourier maps were calculated from the measured structure factors of the germanate. The results for quartz were in good agreement with single-crystal data and R(Bragg) increased from 1.35 to 2.20% as the number of reflections included in the refinement increased from 46 to 119; the e.s.d.'s of the positional parameters were 4 to 8 × 10−4. The germanate gave R(Bragg) 4.85% using 77 Miller planes and the e.s.d.'s were 4 to 42 × 10−4. Special attention was given to the profile fitting function and the non-random particle distributions. The JCPDS Diffraction File Nos. will be reported in a later communication.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1107/S0021889887011567
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  • 10
    Electronic Resource
    Electronic Resource
    Synchrotron X-ray polycrystalline diffractometry (1986)
    Copenhagen : International Union of Crystallography (IUCr)
    Applied crystallography online 19 (1986), S. 92-100 
    Details
    ISSN: 1600-5767
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Geosciences , Physics
    Notes: Results using parallel-beam polycrystalline geometry at the Stanford Storage Ring are compared with conventional X-ray tube focusing. The PC-automated instrumentation included a pair of vertical-scan diffractometers for wavelength selection using a Si(111) channel monochromator and for powder specimens which may be measured in reflection or transmission. The dependence of intensity, profile shape, width and position on instrument parameters is described. All the profiles in patterns of well crystallized specimens with a selected receiving slit are symmetrical and primarily Gaussian with nearly the same width, thereby greatly simplifying the algorithms and programs for profile fitting and interpretation of profile broadening. The easy wavelength selection allows the use of a wavelength just longer than the absorption edge of elements in the sample to obtain maximum P/B ratio, and short wavelengths permit access to very high hkls. Because of the absence of the Kα doublet and the simple symmetrical profile shape the resolution need not be as good as in focusing geometry to achieve comparable overlap separation. The average precision of lattice-parameter determination was Δd/d = 5.6 × 10−5 using forward reflections.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1107/S0021889886089859
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