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  • 1
    Monograph available for loan
    Monograph available for loan
    Extraterrestrials - Where are They? (1995)
    Cambridge : Cambridge University Press
    Details Availability
    Call number: PIK N 322-99-0435
    Type of Medium: Monograph available for loan
    Pages: 239 p.
    Edition: 2. ed.
    ISBN: 0521448034
    Location: A 18 - must be ordered
    Branch Library: PIK Library
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  • 2
    Electronic Resource
    Electronic Resource
    Form and feeding mechanism of a living Planctosphaera pelagica (phylum Hemichordata) (1994)
    Springer
    Marine biology 120 (1994), S. 521-533 
    Details
    ISSN: 1432-1793
    Source: Springer Online Journal Archives 1860-2000
    Topics: Biology
    Notes: Abstract We describe aspects of the anatomy and suspension-feeding mechanism of a single Planctosphaera pelagica captured from the plankton in June 1992 off Bermuda in the western Atlantic. We also describe several unusual features of the larva, including its occurrence in surface waters, unusually large size, and limited swimming ability. Our account of the form and feeding behavior of P. pelagica is the first based on observations of a specimen captured and observed alive. Our limited observations suggest that the planctosphaera may use a suspension-feeding mechanism much like that of the other feeding deuterostome larvae (the pluteus and bipinnaria larvae of echinoderms and the tornaria larva of enteropneust hemichordates) known to capture food particles using a single ciliated band. Although we could not observe cilia directly, the movement of dye streams and food particles and the structure of the ciliated band suggest that some particles may be captured at the ciliated band by the reversal of ciliary beat. The planctosphaera possesses many prominent mucous glands near the food grooves. This suggests an important role of mucus in the biology of the larva, but we were not able to observe directly any role of mucus in particle capture.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1007/BF00350072
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  • 3
    Electronic Resource
    Electronic Resource
    Powder Diffraction using Synchrotron Radiation (1991)
    s.l. ; Stafa-Zurich, Switzerland
    Materials science forum Vol. 79-82 (Jan. 1991), p. 447-454 
    Details
    ISSN: 1662-9752
    Source: Scientific.Net: Materials Science & Technology / Trans Tech Publications Archiv 1984-2008
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
    Type of Medium: Electronic Resource
    URL: http://www.tib-hannover.de/fulltexts/2011/0528/02/21/transtech_doi~10.4028%252Fwww.scientific.net%252FMSF.79-82.447.pdf
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  • 4
    Electronic Resource
    Electronic Resource
    Parallel Beam Powder Diffractometry Using Synchrotron Radiation (1986)
    s.l. ; Stafa-Zurich, Switzerland
    Materials science forum Vol. 9 (Jan. 1986), p. 39-46 
    Details
    ISSN: 1662-9752
    Source: Scientific.Net: Materials Science & Technology / Trans Tech Publications Archiv 1984-2008
    Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
    Type of Medium: Electronic Resource
    URL: http://www.tib-hannover.de/fulltexts/2011/0528/02/21/transtech_doi~10.4028%252Fwww.scientific.net%252FMSF.9.39.pdf
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  • 5
    Electronic Resource
    Electronic Resource
    Adjustable resolution Bragg reflection systems (1984)
    [S.l.] : International Union of Crystallography (IUCr)
    Acta crystallographica 40 (1984), S. 502-507 
    Details
    ISSN: 1600-5724
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Chemistry and Pharmacology , Geosciences , Physics
    Notes: In this paper is described the realization of an idea due to J. W. M. Dumond who, almost 50 years ago, suggested that Bragg diffraction peaks might be made narrower by multiple reflection [Dumond (1937). Phys. Rev. 52, 872-883]. The optical elements which result belong to a family of harmonic free monochromators, X-ray and neutron polarizers whose properties make feasible many new Bragg diffraction optical systems.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1107/S0108767384001070
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  • 6
    Electronic Resource
    Electronic Resource
    A new approach to the measurement of X-ray structure amplitudes determined by the Pendellösung method (1985)
    [S.l.] : International Union of Crystallography (IUCr)
    Acta crystallographica 41 (1985), S. 48-55 
    Details
    ISSN: 1600-5724
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Chemistry and Pharmacology , Geosciences , Physics
    Notes: The Laue-case rocking curve from two thin crystals is known to exhibit fine structure which can be used to determine the corresponding structure amplitude Fh. Thus F444 and F777 have been measured for crystalline silicon to a standard deviation of 0.2%. F444 is in excellent agreement with published experimental values. There are no previous high-precision measurements of F777 in the literature. The values measured seem to indicate that the accepted theoretical dispersion corrections are somewhat too low. A highly stable monolithic thin-wafer silicon dittractometer of a novel design was employed. Using an energy-dispersive solid-state detector and the white spectrum of a tungsten X-ray tube, rocking curves from a number of planes of the hhh family could be recorded simultaneously, thus reducing measurement time considerably and minimizing the influence of some sources of systematic and random error. Least-squares computer fitting of the theoretical curve to the complete measured one is employed to determine the value of Fh from the data. A complete discussion of the method is presented.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1107/S0108767385000083
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  • 7
    Electronic Resource
    Electronic Resource
    Direct measurements of the complex X-ray atomic scattering factors for elements by X-ray interferometry at the Daresbury Synchrotron Radiation Source (1986)
    [S.l.] : International Union of Crystallography (IUCr)
    Acta crystallographica 42 (1986), S. 456-464 
    Details
    ISSN: 1600-5724
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Chemistry and Pharmacology , Geosciences , Physics
    Notes: A scanning X-ray interferometer system [Hart & Siddons (1981). Proc. R. Soc. London Ser. A, 376, 465-482] has been rebuilt for operation at the SERC Daresbury Synchrotron Radiation Source (SRS). The SRS permits an increase in energy resolution by one decade and simultaneously an intensity gain of one thousand times, though in practice the solid-state detector employed limited the peak intensity utilized so that experiments which hitherto demanded one month of counting time are now performed at higher spectral resolution in 2-4 h. Absolute measurements are reported of f' and f” for the K edges of most elements between 34Se and 26Fe and for L edges of 79Au and 74W over energy ranges of about ± 2 keV near absorption edges and scans with better than 1 eV energy resolution of X-ray absorption near edge structure (XANES) and extended X-ray absorption fine structure (EXAFS) spectra near the edges. Over wide energy ranges the results are compared with the most recent calculations of Cromer & Liberman [Acta Cryst. (1981), A37, 267-268], which are now easily available to workers in the field.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1107/S0108767386098884
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  • 8
    Electronic Resource
    Electronic Resource
    Absolute measurement of structure factors using a new dynamical interference effect (1970)
    [S.l.] : International Union of Crystallography (IUCr)
    Acta crystallographica 26 (1970), S. 223-229 
    Details
    ISSN: 1600-5724
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Chemistry and Pharmacology , Geosciences , Physics
    Notes: A new method of determining X-ray scattering factors by dynamical interference is described. The theoretical background to the interference effect is discussed in detail and an expression for relating the fringe period to the structure factor is developed. The method relies on anomalous transmission and is therefore most suitable for measurements on nearly perfect crystals of high atomic weight. It also has the attractive property of being insensitive to slowly varying lattice strains. Applying the method to the 220 reflexion of silicon a value of 8.487 ± 0.017 for the atomic scattering factor has been obtained using Mo Kα1 radiation. This value is in excellent agreement with the author's previous results using the Pendellösung method.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1107/S056773947000058X
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  • 9
    Electronic Resource
    Electronic Resource
    An absolute measurement of the lattice parameter of germanium using multiple-beam X-ray diffractometry (1975)
    [S.l.] : International Union of Crystallography (IUCr)
    Acta crystallographica 31 (1975), S. 364-367 
    Details
    ISSN: 1600-5724
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Chemistry and Pharmacology , Geosciences , Physics
    Notes: The d spacing of the 355 reflexion in silicon has been compared with the d spacing of the 800 reflexion in germanium using pseudo non-dispersive multiple-beam X-ray diffractometry with Mo Ka1 radiation. This technique gives the ratio of the two lattice parameters without the need for a precise knowledge of the X-ray wavelength. Symmetric transmission geometry was used to eliminate the refractive index correction. The results were: {{d(800 Ge)}\over{d(355 Si)}} = 1.0002348 (± 0.0000006) at 22.5 °C and {{d(800 Ge)}\over{d(355 Si}} = 1.0002458 ( ± 0-0000016) at 25 °C. By using the known lattice parameter of silicon obtained by X-ray and optical interferometry it was found that the lattice parameter of germanium at 25 °C is 5.6579060 ± 0.0000092 Å.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1107/S0567739475000769
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  • 10
    Electronic Resource
    Electronic Resource
    X-ray diffraction by L. V. Azaroff, R. Kaplow, N. Kato, R. J. Weiss, A. J. C. Wilson and R. A. Young (1975)
    [S.l.] : International Union of Crystallography (IUCr)
    Acta crystallographica 31 (1975), S. 878-878 
    Details
    ISSN: 1600-5724
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Chemistry and Pharmacology , Geosciences , Physics
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1107/S0567739475001933
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