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  • American Institute of Physics (AIP)  (1)
  • 1990-1994  (1)
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    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 61 (1990), S. 1064-1067 
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: A new method is presented to measure the polarization dependence of double-differential cross sections for the scattering of laser-excited atoms. This allows us to study these polarization effects separated for different scattering processes, which contribute to the total differential cross section at one laboratory angle. A first application demonstrates that the new technique allows us to study the polarization dependence of the reactive and the nonreactive cross sections for collisions of Na(32P3/2) with HF molecules even though, in this example, the polarization dependence of the total differential cross section is only 0.5%.
    Type of Medium: Electronic Resource
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