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  • American Institute of Physics (AIP)  (8)
  • 1995-1999  (3)
  • 1990-1994  (5)
  • 1970-1974
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  • 1
    Electronic Resource
    Electronic Resource
    Combined ultrahigh vacuum scanning tunneling microscope scanning electron microscope system (1996)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 67 (1996), S. 2269-2273 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: We describe a combined ultrahigh vacuum scanning tunneling microscope (STM)–scanning electron microscope (SEM) system, which allows to position the STM tip with respect to the sample within an area of 5 mm×5 mm under SEM control. While the SEM resolution is sufficient to clearly resolve sub-μm structures on the samples, the STM features atomic resolution on semiconductor surfaces. The combination of SEM and STM allows high-resolution studies on inhomogeneous samples in materials research as well as the use for micro- and nanoelectronic device characterization or device modification. The STM performance was checked by atomically resolved imaging of Si(111) (7×7) surfaces. The STM/SEM combination and its application in device characterization is demonstrated by the investigation of vertically grown resonant tunneling diodes on an AlAs/GaAs basis. Due to its performance the system has a high potential for high-resolution imaging in materials research, for novel device characterization and nanoscale structuring or modification of very small devices. © 1996 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1147045
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  • 2
    Electronic Resource
    Electronic Resource
    Fiber interferometer-based variable temperature scanning force microscope (1997)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 68 (1997), S. 1776-1778 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: A scanning force microscope designed for an operation at temperatures between 4.2 and 300 K is presented. The deflection of the microfabricated force sensing cantilever is detected via an optical fiber interferometer. For low temperature imaging the whole instrument is incorporated into a bath cryostat which is suitable for both liquid helium and liquid nitrogen cooling. The instrument is of highly symmetric design in order to avoid large inner misalignment of the interferometer due to thermal expansion/contraction during temperature changes. In addition to this thermally compensated design, the interferometer can be adjusted by piezo actuators in situ in three dimensions. © 1997 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1147992
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  • 3
    Electronic Resource
    Electronic Resource
    Improved microtips for scanning probe microscopy (1990)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 61 (1990), S. 2538-2541 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: Improved electrochemical techniques for the reproducible fabrication of sharp metallic tips are presented. Radii of curvature down to 10 nm make the tips particularly suitable for scanning tunneling microscopy (STM) and atomic force microscopy (AFM). Additionally, simple methods are developed for preparing AFM cantilevers. A new type of spherical probe suitable for long-range scanning force microscopy has been fabricated. The probes consist of nearly perfect spheres with adjustable radii between about 50 and several 100 nm deposited at the very tip of tiny probe holders. Both probe and probe holder may consist of any metal. First experimental investigations confirm that the spherical probes are particularly suitable for van der Waals and magnetic force microscopy.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1141911
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  • 4
    Electronic Resource
    Electronic Resource
    Anisotropic low-field magnetoresistance of polycrystalline manganite sensors (1999)
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 74 (1999), S. 2513-2515 
    Details
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Magnetic-field sensors of bulk La0.67Sr0.33MnO3 and La0.67Ba0.33MnO3 were fabricated. The investigations show that a large low-field magnetoresistance (MR) is exhibited by the polycrystalline samples. MR ratios of the sensors as large as 20% at 77 K and 1.5% at 298 K were observed in fields of 700 Oe. Corresponding field sensitivities as high as 170%/T at 3 mT and 298 K, and 700%–960%/T at 3–8 mT and 77 K were obtained. The low-field MR is associated with intergranular transport of spin-polarized electrons. It is found to be highly anisotropic. The phenomenon is discussed in terms of spin-polarized transport through two kinds of grain boundaries. These represent two extremes of grain-boundary environments. © 1999 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.123024
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  • 5
    Electronic Resource
    Electronic Resource
    Probe calibration in magnetic force microscopy (1990)
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 57 (1990), S. 2612-2614 
    Details
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Quantitative image interpretation in magnetic force microscopy requires information about the geometric and magnetic configuration of the employed microprobe. If the magnetic microfield of a given sample is known in detail, a calibration of the probe is possible. Using the well-defined current-induced microfield of a nanolithographically structured conducting pattern, calibration measurements combined with model calculations provide an insight into the effective domain configuration of magnetic force microscopy probes.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.103827
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  • 6
    Electronic Resource
    Electronic Resource
    Magnetic force microscopy of domain wall stray fields on single-crystal iron whiskers (1990)
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 56 (1990), S. 2578-2580 
    Details
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Using a capacitively controlled force microscope we have imaged typical domain wall configurations like 90° closure structures and subdivided 180° wall segments in single-crystal iron whiskers. Differences in wall contrast between 90° and 180° domain walls are clearly observed. The effect of tip-to-sample distance on lateral resolution and wall contrast in magnetic force microscopy is shown.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.102847
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  • 7
    Electronic Resource
    Electronic Resource
    Scanning tunneling microscopy of the Abrikosov flux lattice with ferromagnetic probes (1990)
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 57 (1990), S. 2351-2353 
    Details
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Using a low-temperature scanning tunneling microscope spatial variations of the current-voltage characteristics have been investigated on NbSe2 single crystals employing PtIr and ferromagnetic Ni tips. At 4.2 K a clear superconducting energy gap is visible even when tunneling through the Ni tip. After field-induced transfer of the sample into the superconducting mixed state a complete Abrikosov flux lattice is imaged for both types of probes by recording the tunneling current at a fixed voltage within the superconducting gap. Comparison of the images obtained by the two probe materials clearly shows that no distortion of the flux lattice is produced by magnetostatic interactions between the ferromagnetic tip and the individual vortices. This provides the basis for future investigations of flux distributions in superconductors by magnetic force microscopy.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.104170
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  • 8
    Electronic Resource
    Electronic Resource
    Electron holography in the study of the leakage field of magnetic force microscope sensor tips (1993)
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 62 (1993), S. 1839-1841 
    Details
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Electron holography is applied to the investigation of the leakage magnetic field produced by sharp ferromagnetic probes employed for magnetic force microscopy. Using the double exposure technique, interference fringes were obtained which show a good qualitative agreement with calculations based on a macroscopic dipole model for the sensor tips. Magnetic flux measurements are possible through the evaluation of the phase difference in the simulated map of the dipole field.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.109566
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