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  • American Institute of Physics (AIP)  (15)
  • 2000-2004  (1)
  • 1990-1994  (14)
  • 1
    Electronic Resource
    Electronic Resource
    GaAs surface reconstruction obtained using a dry process (1993)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 73 (1993), S. 2035-2037 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: We report attaining Ga-terminated (4×2) surface reconstruction on virgin GaAs substrates using a completely dry process at temperatures below the oxide sublimation temperature and without group V overpressure. The native oxides are removed with an electron cyclotron resonance hydrogen plasma treatment, followed by annealing at 500 °C in ultrahigh vacuum, which yields a reconstructed surface suitable for epitaxial overgrowth. Characterization by secondary ion mass spectroscopy and transmission electron microscopy reveals the complete removal of O, reduced C, and high structural order at the epilayer/substrate interface when this preparation method is used before molecular beam epitaxy. Annealing the substrate at a lower temperature yields a nonreconstructed surface possessing significant impurity concentrations, and leads to dislocation defects at the epilayer/substrate interface.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.353148
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  • 2
    Electronic Resource
    Electronic Resource
    Application of microwave detection of the Shubnikov–de Haas effect in two-dimensional systems (1993)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 73 (1993), S. 7533-7542 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Microwave detection of the Shubnikov–de Haas (SdH) effect as a contact-free characterization technique for different types of two-dimensional semiconductor structures is explored in the low magnetic field region. The detection technique and the data analysis are described. The character and relevance of the single-particle relaxation time that can be detected by this technique are distinguished from the usual transport scattering time. The measured values of the carrier concentration and single-particle relaxation time agree with electrical measurements, while the problem of making contacts on the structure is avoided. Uncertainties in the analysis for the single-particle relaxation time are discussed. Cyclotron resonance, optically detected cyclotron resonance, and magneto-photoluminescence are applied as other contact-free techniques on the same samples. The results and suitability of these techniques are compared with the microwave detection of the SdH effect.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.354001
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  • 3
    Electronic Resource
    Electronic Resource
    Calculated structures for [001] symmetrical tilt grain boundaries in silicon (1991)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 69 (1991), S. 2048-2056 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The structures of [001] tilt boundaries in silicon have been systematically investigated by computer modeling, using the harmonic Keating potential to describe the interatomic forces. The full angular range of symmetrical tilt boundaries can be described in terms of linear combinations of characteristic groupings of atoms. More than one stable relaxed structure has been found for most grain boundaries. In all cases the relaxed bicrystal consists of localized groups of pure edge or 45° dislocation cores embedded in a tetrahedrally coordinated, stable structure.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.348730
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  • 4
    Electronic Resource
    Electronic Resource
    An instrument for measuring circular dichroism simultaneously at all wavelengths in a limited spectral range (1991)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 62 (1991), S. 1912-1915 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: An instrument is described for the simultaneous measurement of circular dichroism at all wavelengths in a limited spectral range. A polychromator and a charge-coupled device (CCD), serving as multichannel sensor, are arranged behind the sample cell, which is located close to the entrance slit, in contrast to the arrangement of a monochromator before the cell and using a photomultiplier as radiation detector, as usual until now. The CCD with low-noise electronics is driven by the system clock of a microprocessing unit controlled by a quartz oscillator and works fully synchronously with modulation and acquisition cycles. This leads to a high suppression of noise and systematic deviations. An electro-optic modulator with approximately rectangular excitation voltage is used. Partial CD spectra over the range of 80 nm each down to 200 nm have been recorded. The detection of a smaller amount of substance is possible than with other modern commercial instruments such as a JASCO J-600, with the same signal-to-noise ratio.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1142391
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  • 5
    Electronic Resource
    Electronic Resource
    Near-infrared acousto-optic tunable filter based instrumentation for the measurement of dynamic spectra of polymers (2001)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 72 (2001), S. 2153-2158 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: The use of an acousto-optic tunable filter spectrometer can simplify the instrumental requirements for the collection of time resolved spectra to measure the difference in absorbance of polarized radiation due to chemical functional group orientation of a polymer as it undergoes repetitive oscillatory strain. The rapid data collection achieved in the near-infrared spectral region rivals that of current interferometric instruments. Achieving a good signal to noise ratio requires only a singly modulated optical signal, and the use of digital filtering eliminates the requirement of phase sensitive detection. The usefulness of this instrument for routine testing of polymers is demonstrated by differentiating polymers of the same chemical composition but different rheology and by determining the effect of varying the concentration of monomers in a copolymer. © 2001 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1355265
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  • 6
    Electronic Resource
    Electronic Resource
    Removal of GaAs surface contaminants using H2 electron cyclotron resonance plasma treatment followed by Cl2 chemical etching (1993)
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 62 (1993), S. 2658-2660 
    Details
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: We report a novel dry process to remove the surface contaminants C, Si, and O from GaAs substrates. This method utilizes an electron cyclotron resonance hydrogen plasma to remove the native oxides, followed by a very brief Cl2 chemical etching of GaAs to further reduce C and Si residues, and a final vacuum anneal. Characterization by secondary ion-mass spectrometry (SIMS) typically reveals the removal of C, Si, and O at the overgrown/processed interface to the levels below the SIMS detection limit. The as-processed GaAs surface, a Ga-stabilized reconstructed (4×6), is atomically smooth, and is as clean as a surface of freshly grown GaAs epilayers.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.109277
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  • 7
    Electronic Resource
    Electronic Resource
    Spin dependent recombination in Pt-doped silicon p-n junctions (1992)
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 60 (1992), S. 1857-1859 
    Details
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Electrically detected magnetic resonance experiments showing spin dependent recombination in commercial p-n diodes are presented. The observed anisotropy in the g values along with the marked shift from the free electron g-value point to a metal-vacancy complex. Deep level transient spectroscopy reveals the presence of the Pt acceptor level (0/−) at Ec−0.23 eV and the donor level (+/0) at Ev+0.32 eV in the same device. Calculations of the recombination rates support that spin dependent recombination occurs at the Pt (+/0) donor level.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.107160
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  • 8
    Electronic Resource
    Electronic Resource
    X-ray photoemission characterization of thin epitaxial Fe silicide phases on Si(111) (1993)
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 63 (1993), S. 2360-2362 
    Details
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Depending on preparation conditions, Fe silicides grown on Si(111) by means of solid phase epitaxy and molecular beam epitaxy show the formation of the bulk ε-FeSi and β-FeSi2 phases as well as epitaxially grown metastable CsCl- and CaF2-type Fe silicides. The valence-band of these Fe silicides are measured with monochromatized Al Kα x-ray photoemission and angle resolved ultraviolet photoemission and are found to be in remarkable agreement with calculated densities of states.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.110501
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  • 9
    Electronic Resource
    Electronic Resource
    Temperature characteristics of (InAs)1/(GaAs)4 short-period superlattices quantum well laser (1993)
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 62 (1993), S. 2018-2020 
    Details
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The temperature characteristics of (InAs)1/(GaAs)4 superlattice quantum well lasers are analyzed both experimentally and theoretically. The measured threshold current density as a function of temperature is characterized by a T0=135 K for 115 K〈T〈380 K and by T0=47 K for 420 K〈T〈480 K. The radiative and nonradiative recombination rates and the gain versus carrier density relationship in monolayer superlattice structures are calculated. Inclusion of the nonradiative recombination process is necessary to explain the observed high-temperature characteristics of these lasers.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.109521
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  • 10
    Electronic Resource
    Electronic Resource
    Molecular beam epitaxial regrowth on in situ plasma-etched AlAs/AlGaAs heterostructures (1992)
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 60 (1992), S. 1738-1740 
    Details
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Epitaxial regrowth by solid-source molecular beam epitaxy (MBE) on dry etched heterostructures possessing exposed AlAs surfaces is accomplished for the first time using a vacuum integrated processing. Samples composed of multilayers of AlAs and AlGaAs are patterned with a SiO2 mask and are anisotropically etched using a low damage electron cyclotron resonance (ECR) SiCl4 plasma process. Etched samples are transferred in ultrahigh vacuum between the ECR and MBE chambers to avoid atmospheric exposure before regrowth. Microstructural analysis of the overgrown layers by scanning and transmission electron microscopy indicates that epitaxial regrowth on both the etched field and vertical sidewalls is achieved. The regrown material is found to contain microtwin plates, but few dislocations, indicating the good quality of the overgrowth.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.107202
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