Publication Date:
2014-11-11
Description:
We examine the evolution of the surface morphology as well as the dynamics of grain growth and grain boundary (GB) grooving in polycrystalline CdTe films sputter deposited on CdS/glass substrates. Anomalous scaling behavior is found with local roughness exponent α loc = 1 and global (local) growth exponent β = 0.36 ( β loc = 0.14). In good agreement with the scaling relation, β loc = β − nα loc , we obtain the correlation length exponent n = 1 / z ≃ 0.23 . We also find that the grain size coarsening exponent p and GB groove growth exponent β g are both equal to β , while the grain size distribution is well described by a log-normal distribution. These results suggest that GB grooving is responsible for the enhanced anomalous scaling and a deviation from the theoretical prediction of p = 1/2, along with the observed log-normal grain size distribution.
Print ISSN:
0021-8979
Electronic ISSN:
1089-7550
Topics:
Physics
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