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  • 1
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    Surface and bulk electronic structure of the strongly correlated system SmB_{6} and implications for a topological Kondo insulator (2013)
    American Physical Society (APS)
    Details
    Publikationsdatum: 2013-09-11
    Beschreibung: Author(s): N. Xu, X. Shi, P. K. Biswas, C. E. Matt, R. S. Dhaka, Y. Huang, N. C. Plumb, M. Radović, J. H. Dil, E. Pomjakushina, K. Conder, A. Amato, Z. Salman, D. McK. Paul, J. Mesot, H. Ding, and M. Shi Recent theoretical calculations and experimental results suggest that the strongly correlated material SmB 6 may be a realization of a topological Kondo insulator. We have performed an angle-resolved photoemission spectroscopy study on SmB 6 in order to elucidate elements of the electronic structure r... [Phys. Rev. B 88, 121102] Published Tue Sep 10, 2013
    Schlagwort(e): Electronic structure and strongly correlated systems
    Print ISSN: 1098-0121
    Digitale ISSN: 1095-3795
    Thema: Physik
    Publiziert von American Physical Society (APS)
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  • 2
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    SU(2)-invariant spin liquids on the triangular lattice with spinful Majorana excitations (2011)
    American Physical Society (APS)
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    Publikationsdatum: 2011-06-29
    Beschreibung: Author(s): Rudro R. Biswas, Liang Fu, Chris R. Laumann, and Subir Sachdev We describe a new class of spin liquids with global SU(2) spin-rotation symmetry in spin-1/2 systems on the triangular lattice, which have real Majorana fermion excitations carrying spin S =1 . The simplest translationally invariant mean-field state on the triangular lattice breaks time-reversal symme... [Phys. Rev. B 83, 245131] Published Tue Jun 28, 2011
    Schlagwort(e): Electronic structure and strongly correlated systems
    Print ISSN: 1098-0121
    Digitale ISSN: 1095-3795
    Thema: Physik
    Publiziert von American Physical Society (APS)
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  • 3
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    Valence-band study of Sm0.1Ca0.9−xSrxMnO3 using high-resolution ultraviolet photoelectron spectroscopy (2014)
    American Physical Society (APS)
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    Publikationsdatum: 2014-06-25
    Beschreibung: Author(s): M. K. Dalai, B. R. Sekhar, D. Biswas, S. Thakur, T.-C. Chiang, D. Samal, C. Martin, and K. Maiti We have studied the concentration-dependent near-Fermi-level valence-band electronic structure of Sm0.1Ca0.9−xSrxMnO3 (x=0, 0.1, 0.3, and 0.6) using high-resolution ultraviolet photoelectron spectroscopy (HRUPS) across the metal insulator transition. At low temperatures (50 and 100 K), a transformat... [Phys. Rev. B 89, 245131] Published Tue Jun 24, 2014
    Schlagwort(e): Electronic structure and strongly correlated systems
    Print ISSN: 1098-0121
    Digitale ISSN: 1095-3795
    Thema: Physik
    Publiziert von American Physical Society (APS)
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  • 4
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    Exotic Kondo crossover in a wide temperature region in the topological Kondo insulator SmB6 revealed by high-resolution ARPES (2014)
    American Physical Society (APS)
    Details
    Publikationsdatum: 2014-08-29
    Beschreibung: Author(s): N. Xu, C. E. Matt, E. Pomjakushina, X. Shi, R. S. Dhaka, N. C. Plumb, M. Radović, P. K. Biswas, D. Evtushinsky, V. Zabolotnyy, J. H. Dil, K. Conder, J. Mesot, H. Ding, and M. Shi Temperature dependence of the electronic structure of SmB6 is studied by high-resolution angle-resolved photoemission spectroscopy (ARPES) down to 1 K. We demonstrate that there is no essential difference for the dispersions of the surface states below and above the resistivity saturating anomaly (∼... [Phys. Rev. B 90, 085148] Published Thu Aug 28, 2014
    Schlagwort(e): Electronic structure and strongly correlated systems
    Print ISSN: 1098-0121
    Digitale ISSN: 1095-3795
    Thema: Physik
    Publiziert von American Physical Society (APS)
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  • 5
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    Low-temperature magnetic fluctuations in the Kondo insulator SmB6 (2014)
    American Physical Society (APS)
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    Publikationsdatum: 2014-04-15
    Beschreibung: Author(s): P. K. Biswas, Z. Salman, T. Neupert, E. Morenzoni, E. Pomjakushina, F. von Rohr, K. Conder, G. Balakrishnan, M. Ciomaga Hatnean, M. R. Lees, D. McK. Paul, A. Schilling, C. Baines, H. Luetkens, R. Khasanov, and A. Amato We present the results of a systematic investigation of the magnetic properties of the three-dimensional Kondo topological insulator SmB6 using magnetization and muon-spin relaxation/rotation (μSR) measurements. The μSR measurements exhibit magnetic field fluctuations in SmB6 below ∼15 K due to elec... [Phys. Rev. B 89, 161107] Published Mon Apr 14, 2014
    Schlagwort(e): Electronic structure and strongly correlated systems
    Print ISSN: 1098-0121
    Digitale ISSN: 1095-3795
    Thema: Physik
    Publiziert von American Physical Society (APS)
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  • 6
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    A Model-based Prognostics Methodology for Electrolytic Capacitors Based on Electrical Overstress Accelerated Aging (2011)
    In:  CASI
    Details
    Publikationsdatum: 2019-07-27
    Beschreibung: A remaining useful life prediction methodology for electrolytic capacitors is presented. This methodology is based on the Kalman filter framework and an empirical degradation model. Electrolytic capacitors are used in several applications ranging from power supplies on critical avionics equipment to power drivers for electro-mechanical actuators. These devices are known for their comparatively low reliability and given their criticality in electronics subsystems they are a good candidate for component level prognostics and health management. Prognostics provides a way to assess remaining useful life of a capacitor based on its current state of health and its anticipated future usage and operational conditions. We present here also, experimental results of an accelerated aging test under electrical stresses. The data obtained in this test form the basis for a remaining life prediction algorithm where a model of the degradation process is suggested. This preliminary remaining life prediction algorithm serves as a demonstration of how prognostics methodologies could be used for electrolytic capacitors. In addition, the use degradation progression data from accelerated aging, provides an avenue for validation of applications of the Kalman filter based prognostics methods typically used for remaining useful life predictions in other applications.
    Schlagwort(e): Electronics and Electrical Engineering
    Materialart: ARC-E-DAA-TN3987 , Annual Conference of the PHM Society 2011; 25-29 Sept. 2011; Montreal/Canada; United States
    Format: application/pdf
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  • 7
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    Physics Based Electrolytic Capacitor Degradation Models for Prognostic Studies under Thermal Overstress (2012)
    In:  CASI
    Details
    Publikationsdatum: 2019-07-13
    Beschreibung: Electrolytic capacitors are used in several applications ranging from power supplies on safety critical avionics equipment to power drivers for electro-mechanical actuators. This makes them good candidates for prognostics and health management research. Prognostics provides a way to assess remaining useful life of components or systems based on their current state of health and their anticipated future use and operational conditions. Past experiences show that capacitors tend to degrade and fail faster under high electrical and thermal stress conditions that they are often subjected to during operations. In this work, we study the effects of accelerated aging due to thermal stress on different sets of capacitors under different conditions. Our focus is on deriving first principles degradation models for thermal stress conditions. Data collected from simultaneous experiments are used to validate the desired models. Our overall goal is to derive accurate models of capacitor degradation, and use them to predict performance changes in DC-DC converters.
    Schlagwort(e): Electronics and Electrical Engineering
    Materialart: ARC-E-DAA-TN5005 , First European Conference of the Prognostics and Health; Jul 03, 2012; Dresden; Germany
    Format: application/pdf
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  • 8
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    Prognostics of Power Electronics, Methods and Validation Experiments (2012)
    In:  CASI
    Details
    Publikationsdatum: 2019-07-13
    Beschreibung: Abstract Failure of electronic devices is a concern for future electric aircrafts that will see an increase of electronics to drive and control safety-critical equipment throughout the aircraft. As a result, investigation of precursors to failure in electronics and prediction of remaining life of electronic components is of key importance. DC-DC power converters are power electronics systems employed typically as sourcing elements for avionics equipment. Current research efforts in prognostics for these power systems focuses on the identification of failure mechanisms and the development of accelerated aging methodologies and systems to accelerate the aging process of test devices, while continuously measuring key electrical and thermal parameters. Preliminary model-based prognostics algorithms have been developed making use of empirical degradation models and physics-inspired degradation model with focus on key components like electrolytic capacitors and power MOSFETs (metal-oxide-semiconductor-field-effect-transistor). This paper presents current results on the development of validation methods for prognostics algorithms of power electrolytic capacitors. Particularly, in the use of accelerated aging systems for algorithm validation. Validation of prognostics algorithms present difficulties in practice due to the lack of run-to-failure experiments in deployed systems. By using accelerated experiments, we circumvent this problem in order to define initial validation activities.
    Schlagwort(e): Electronics and Electrical Engineering
    Materialart: ARC-E-DAA-TN7926 , IEEE Autotestcon; Sep 10, 2012 - Sep 12, 2012; Anaheim, CA; United States
    Format: application/pdf
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  • 9
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    Physics Based Modeling and Prognostics of Electrolytic Capacitors (2012)
    In:  CASI
    Details
    Publikationsdatum: 2019-07-13
    Beschreibung: This paper proposes first principles based modeling and prognostics approach for electrolytic capacitors. Electrolytic capacitors have become critical components in electronics systems in aeronautics and other domains. Degradations and faults in DC-DC converter unit propagates to the GPS and navigation subsystems and affects the overall solution. Capacitors and MOSFETs are the two major components, which cause degradations and failures in DC-DC converters. This type of capacitors are known for its low reliability and frequent breakdown on critical systems like power supplies of avionics equipment and electrical drivers of electromechanical actuators of control surfaces. Some of the more prevalent fault effects, such as a ripple voltage surge at the power supply output can cause glitches in the GPS position and velocity output, and this, in turn, if not corrected will propagate and distort the navigation solution. In this work, we study the effects of accelerated aging due to thermal stress on different sets of capacitors under different conditions. Our focus is on deriving first principles degradation models for thermal stress conditions. Data collected from simultaneous experiments are used to validate the desired models. Our overall goal is to derive accurate models of capacitor degradation, and use them to predict performance changes in DC-DC converters.
    Schlagwort(e): Electronics and Electrical Engineering
    Materialart: ARC-E-DAA-TN5352 , AIAA @ Infotec 2012; Jun 19, 2012 - Jun 21, 2012; Garden Grove, CA; United States
    Format: application/pdf
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  • 10
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    Bayesian Framework Approach for Prognostic Studies in Electrolytic Capacitor under Thermal Overstress Conditions (2012)
    In:  CASI
    Details
    Publikationsdatum: 2019-07-13
    Beschreibung: Electrolytic capacitors are used in several applications ranging from power supplies for safety critical avionics equipment to power drivers for electro-mechanical actuator. Past experiences show that capacitors tend to degrade and fail faster when subjected to high electrical or thermal stress conditions during operations. This makes them good candidates for prognostics and health management. Model-based prognostics captures system knowledge in the form of physics-based models of components in order to obtain accurate predictions of end of life based on their current state of heal th and their anticipated future use and operational conditions. The focus of this paper is on deriving first principles degradation models for thermal stress conditions and implementing Bayesian framework for making remaining useful life predictions. Data collected from simultaneous experiments are used to validate the models. Our overall goal is to derive accurate models of capacitor degradation, and use them to remaining useful life in DC-DC converters.
    Schlagwort(e): Electronics and Electrical Engineering
    Materialart: ARC-E-DAA-TN5953 , Annual Conference of the PHM Society 2012; Sep 23, 2012 - Sep 27, 2012; Minneapolis, MN; United States
    Format: application/pdf
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