ISSN:
1573-4803
Source:
Springer Online Journal Archives 1860-2000
Topics:
Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
Notes:
Abstract Electron microscopy and X-ray diffraction have been used to study microstructures of melt-drawn polyethylene films. During the drawing process, uniplanar structures are formed which consist of crystals with theirb andc axes in the film plane. On annealing the films, the crystal size and orientation increase. Quantitative measures of the crystal thickness, lateral crystallite size and long period were obtained from bright-field and dark-field electron micrographs as well as from wide and small angle X-ray diffraction of stacked layers of the films.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1007/BF01058086
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