ISSN:
1089-7623
Source:
AIP Digital Archive
Topics:
Physics
,
Electrical Engineering, Measurement and Control Technology
Notes:
A compact electron-beam ion trap (EBIT) as a multiply charged ion source for medium Z, e.g., Ne10+, Ar18+, Kr26+, and so on, has been developed. A pair of NdFeB permanent magnets generates an intense magnetic field (0.64 T) along with the electron-beam axis. The maximum electron-beam energy and current were designed as 10 keV and 30 mA, respectively. Over 95% of the electron beam up to 20 mA was transmitted to an electron collector. All parts, including electrical feedthroughs, are mounted on a con-flat flange with an 8 in. diam. Portability is added to the EBIT because no cooling system for the electromagnet is needed. Hydrogen-like Ar17+ were extracted. © 2000 American Institute of Physics.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.1150323
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