ISSN:
1077-3118
Source:
AIP Digital Archive
Topics:
Physics
Notes:
A laser interferometric method is described by which the length-to-voltage sensitivity of piezoelectric elements, as used e.g., in scanning tunneling microscopes, can be calibrated. The method is based on measuring the optical frequency of a laser locked to a piezoelectrically tuned interferometer, relative to a stable reference. The high sensitivity of this technique allows the calibration to be carried out in the low-voltage regime.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.101064
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