ISSN:
1551-2916
Source:
Blackwell Publishing Journal Backfiles 1879-2005
Topics:
Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
,
Physics
Notes:
The distribution of yttrium and lanthanum dopants has been mapped in yttrium- and lanthanum-doped polycrystalline aluminas using imaging secondary-ion mass spectrometry (imaging-SIMS). Both dopants segregate to grain boundaries and pore surfaces. On average, yttrium occupies 7.1%–9.0% of the available grain-boundary cation sites, whereas lanthanum occupies only 2.0%–5.2%. In 1000-ppm-yttrium-doped alumina, an abundance of yttrium aluminum garnet precipitates also is observed. Implications of these observations to the creep behavior of alumina are discussed. The similarity in the segregation behavior of yttrium and lanthanum highlights the potential of lanthanum-doped alumina for improved creep properties.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1111/j.1151-2916.1997.tb02840.x
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