ISSN:
1551-2916
Source:
Blackwell Publishing Journal Backfiles 1879-2005
Topics:
Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
,
Physics
Notes:
The composition and structure of interfaces between single crystal Al2O3 (sapphire) samples and liquid Sn–V alloys, containing 1% and 3% V, have been characterized in situ at high temperature using neutron reflection spectroscopy. Measurements made at 900°C are shown to be consistent with a thin (10–25 nm) AlV2O4 layer forming at the solid/liquid interface, with possibly a thinner layer of enhanced V content adjacent to the liquid, to promote wetting. After longer time exposure to temperature this interface layer roughens and a more complex interface structure occurs.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1111/j.1551-2916.2004.00279.x
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