Electronic Resource
[S.l.]
:
American Institute of Physics (AIP)
Review of Scientific Instruments
68 (1997), S. 2494-2498
ISSN:
1089-7623
Source:
AIP Digital Archive
Topics:
Physics
,
Electrical Engineering, Measurement and Control Technology
Notes:
A method of measuring the thermal conductivity of 25 μm wire and of single crystals with dimensions less than 1000×100×10 μm3 is described using the classic longitudinal steady-state method. Data from a Pb-doped Bi2Sr2Ca1Cu2Ox (Bi-2212) whisker is verified with Nb, Pt, and Au standards. Careful application of temperature matching shielding and microthermocouples have produced an absolute measurement with an error less than 25% over the temperature range 30–200 K. A complete accounting of significant errors is reported. © 1997 American Institute of Physics.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1063/1.1148147
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