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  • 1
    Electronic Resource
    Electronic Resource
    Proposed method of separating the particle size and distortion coefficients in line profile analysis (1967)
    Copenhagen : International Union of Crystallography (IUCr)
    Acta crystallographica 23 (1967), S. 174-175 
    Details
    ISSN: 0001-5520
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Geosciences
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1107/S0365110X67002324
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  • 2
    Electronic Resource
    Electronic Resource
    Electron shake-off mechanism of the extended fine structure of X-ray absorption edges
    Amsterdam : Elsevier
    Physics Letters A 41 (1972), S. 47-48 
    Details
    ISSN: 0375-9601
    Source: Elsevier Journal Backfiles on ScienceDirect 1907 - 2002
    Topics: Physics
    Type of Medium: Electronic Resource
    URL: http://linkinghub.elsevier.com/retrieve/pii/0375-9601(72)90627-5
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  • 3
    Electronic Resource
    Electronic Resource
    Revealing the powdering methods of black makeup in Ancient Egypt by fitting microstructure based Fourier coefficients to the whole x-ray diffraction profiles of galena (2002)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 91 (2002), S. 2455-2465 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Galena (PbS) is a major ingredient in ancient Egyptian eye makeup. The microstructure of PbS in Egyptian cosmetic powders is used as a fingerprint and is matched with the microstructures produced artificially in geological galena minerals. The microstructure of PbS is determined by x-ray diffraction peak profile analysis in terms of dislocation density, crystallite size, and size distribution. High-resolution powder diffractograms were measured at the ESRF Grenoble synchrotron source with high resolution and high peak-to-background ratios. The Fourier coefficients of the first nine measured reflections of galena are fitted using physically based Fourier coefficients of strain and size functions. Strain anisotropy is accounted for by the dislocation model of the mean square strain. The x-ray data are supplemented by scanning electron microscopy (SEM) and transmission electron microscopy (TEM) micrographs, and are compared with archæological documents. It enables us to describe the procedures of eye makeup manufacturing in the Middle and New Kingdoms of Egypt some 2000 years before Christ. © 2002 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1429792
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  • 4
    Electronic Resource
    Electronic Resource
    The effect of dislocation contrast on x-ray line broadening: A new approach to line profile analysis (1996)
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 69 (1996), S. 3173-3175 
    Details
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The x-ray line profiles of an ultrafine grained copper crystal, produced by equal-channel angular pressing, were measured by a special high resolution diffractometer with negligible instrumental line broadening. The analysis of the line breadths and the Fourier coefficients have shown that taking into account the contrast caused by dislocations on line profiles gives new scaling factors in the Williamson–Hall plot and in the Warren–Averbach analysis, respectively. When strain is caused by dislocations the new procedure proposed here enables a straightforward determination of particle size and strain, the latter in terms of the dislocation density. © 1996 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.117951
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  • 5
    Electronic Resource
    Electronic Resource
    Crystallite size distribution and dislocation structure determined by diffraction profile analysis: principles and practical application to cubic and hexagonal crystals (2001)
    Copenhagen : International Union of Crystallography (IUCr)
    Applied crystallography online 34 (2001), S. 298-310 
    Details
    ISSN: 1600-5767
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Geosciences , Physics
    Notes: Two different methods of diffraction profile analysis are presented. In the first, the breadths and the first few Fourier coefficients of diffraction profiles are analysed by modified Williamson–Hall and Warren–Averbach procedures. A simple and pragmatic method is suggested to determine the crystallite size distribution in the presence of strain. In the second, the Fourier coefficients of the measured physical profiles are fitted by Fourier coefficients of well established ab initio functions of size and strain profiles. In both procedures, strain anisotropy is rationalized by the dislocation model of the mean square strain. The procedures are applied and tested on a nanocrystalline powder of silicon nitride and a severely plastically deformed bulk copper specimen. The X-ray crystallite size distributions are compared with size distributions obtained from transmission electron microscopy (TEM) micrographs. There is good agreement between X-ray and TEM data for nanocrystalline loose powders. In bulk materials, a deeper insight into the microstructure is needed to correlate the X-ray and TEM results.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1107/S0021889801003715
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  • 6
    Electronic Resource
    Electronic Resource
    Dislocations and Grain Size in Electrodeposited Nanocrystalline Ni Determined by the Modified Williamson–Hall and Warren–Averbach Procedures (1998)
    Copenhagen : International Union of Crystallography (IUCr)
    Applied crystallography online 31 (1998), S. 554-558 
    Details
    ISSN: 1600-5767
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Geosciences , Physics
    Notes: Electrodeposited nanocrystalline Ni foils were studied by high-resolution X-ray diffractometry. The full width at half-maximum and Fourier coefficients were found to vary rather anisotropically as a function of diffraction order. The modified Williamson–Hall plot and the modified Warren–Averbach analysis, developed recently by taking into account the dislocation contrast in peak broadening, have been applied to interpret this anisotropic behaviour in terms of grain size, dislocation densities and twin boundaries. The average grain size has been found to range between 50 and 12 nm, in good agreement with transmission electron microscopy observations. The average dislocation density has been found to be 4.9 (5) × 1015 m−2 and the dislocations are of the screw character.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1107/S0021889897019559
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  • 7
    Electronic Resource
    Electronic Resource
    The contrast factors of dislocations in cubic crystals: the dislocation model of strain anisotropy in practice (1999)
    Copenhagen : International Union of Crystallography (IUCr)
    Applied crystallography online 32 (1999), S. 992-1002 
    Details
    ISSN: 1600-5767
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Geosciences , Physics
    Notes: It has been shown recently that in many cases strain anisotropy in powder diffraction can be well accounted for by the dislocation model of the mean square strain. The practical application assumes knowledge of the individual contrast factors C of dislocations related to particular Burgers, line and diffraction vectors or to the average contrast factors C¯. A simple procedure for the experimental determination of C¯ has been worked out, enabling the determination of the character of the dislocations in terms of a simple parameter q. The values of the individual C factors were determined numerically for a wide range of elastic constants for cubic crystals. The C¯ factors and q parameters were parametrized by simple analytical functions, which can be used in a straightforward manner in numerical analyses, as e.g. in Rietveld structure refinement procedures.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1107/S0021889899009334
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  • 8
    Electronic Resource
    Electronic Resource
    The dislocation model of strain anisotropy in whole powder-pattern fitting: the case of an Li–Mn cubic spinel (1999)
    Copenhagen : International Union of Crystallography (IUCr)
    Applied crystallography online 32 (1999), S. 290-295 
    Details
    ISSN: 1600-5767
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Geosciences , Physics
    Notes: Anisotropic strain broadening in X-ray or neutron powder diffraction can cause severe difficulties in whole powder-pattern fitting and Rietveld structure refinement. Several phenomenological models have been proposed to deal with this problem. These, however, lack physically sound bases. In the present work the dislocation-based model of strain anisotropy is applied in the Fourier formalism of profile fitting. It is shown that the anisotropic contrast of dislocations can fully account for strain anisotropy. A few physically sound parameters, namely the average dislocation density, the average coherent domain size, the dislocation arrangement parameter and the dislocation contrast factors, enable a perfect profile fitting to the powder pattern of a cubic Li–Mn spinel obtained at the Daresbury synchrotron storage ring.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1107/S0021889898012710
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  • 9
    Electronic Resource
    Electronic Resource
    Asymmetric X-ray line broadening of plastically deformed crystals. I. Theory (1988)
    Copenhagen : International Union of Crystallography (IUCr)
    Applied crystallography online 21 (1988), S. 47-54 
    Details
    ISSN: 1600-5767
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Geosciences , Physics
    Notes: X-ray diffraction line profiles of plastically deformed Cu single crystals orientated for ideal multiple slip were recently found to be markedly asymmetric. A theory is developed to interpret this kind of asymmetric line broadening in terms of the average dislocation density, the dipole polarization of the dislocation structure and the mean square fluctuation of the dislocation density.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1107/S0021889887009178
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  • 10
    Electronic Resource
    Electronic Resource
    Asymmetric X-ray line broadening of plastically deformed crystals. II. Evaluation procedure and application to [001]-Cu crystals (1989)
    Copenhagen : International Union of Crystallography (IUCr)
    Applied crystallography online 22 (1989), S. 26-34 
    Details
    ISSN: 1600-5767
    Source: Crystallography Journals Online : IUCR Backfile Archive 1948-2001
    Topics: Geosciences , Physics
    Notes: In paper I [Groma, Ungár & Wilkens (1988). J. Appl. Cryst. 21, 47–53] a theory was developed to interpret the asymmetric X-ray line broadening of plastically deformed crystals. It was shown that the dislocation structure can be described by five distinct parameters, namely the dislocation density, the mean quadratic spatial fluctuation of the dislocation density, the effective outer cut-off radius, the dipole polarization and the spatial fluctuation of the dipole polarization of the dislocation structure. In this paper a procedure is developed to evaluate these parameters from the Fourier transform of the line profiles. The theory and this procedure are tested by applying it to the asymmetric line profiles of tensile-deformed Cu single crystals orientated for ideal multiple slip. The asymmetry of these profiles is assigned to the dipole polarization of the dislocation cell structure and is directly correlated to residual long-range internal stresses. It is shown that the data can be interpreted in terms of the quasi-composite model of the dislocation cell structure developed earlier for the same material.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1107/S0021889888009720
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