Publication Date:
2011-01-20
Description:
Author(s): Ingo Tischer, Martin Feneberg, Martin Schirra, Hady Yacoub, Rolf Sauer, Klaus Thonke, Thomas Wunderer, Ferdinand Scholz, Levin Dieterle, Erich Müller, and Dagmar Gerthsen We investigate the 3.32 eV defect-related emission band in GaN correlating transmission electron microscopy and spatially and spectrally resolved cathodoluminescence at low temperature. The band is unambiguously associated with basal plane stacking faults of type I_{2} , which are a common defect ... [Phys. Rev. B 83, 035314] Published Wed Jan 19, 2011
Keywords:
Semiconductors II: surfaces, interfaces, microstructures, and related topics
Print ISSN:
1098-0121
Electronic ISSN:
1095-3795
Topics:
Physics
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