Publication Date:
2019-06-28
Description:
There is strong interest in being able to accurately and sensitively monitor materials degradation in both ground-based and space-based environments. Two optical techniques for sensitive degradation monitoring are reviewed: spectroscopic ellipsometry and photothermal spectroscopy. These techniques complement each other in that ellipsometry is sensitive to atomically thin surface and subsurface changes, and photothermal spectroscopy is sensitive to local defects, pin-holes, subsurface defects, and delamination. Progress in applying these spectroscopies (both ex situ and in situ) to atomic oxygen degradation of space materials is reviewed.
Keywords:
INORGANIC AND PHYSICAL CHEMISTRY
Type:
NASA, Lyndon B. Johnson Space Center, Fourth Annual Workshop on Space Operations Applications and Research (SOAR 90); p 772-777
Format:
application/pdf
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