Publication Date:
2015-08-04
Description:
Author(s): Sven Just, Marcus Blab, Stefan Korte, Vasily Cherepanov, Helmut Soltner, and Bert Voigtländer Four-point measurements using a multitip scanning tunneling microscope are carried out in order to determine surface and step conductivities on Si(111) surfaces. In a first step, distance-dependent four-point measurements in the linear configuration are used in combination with an analytical three-l… [Phys. Rev. Lett. 115, 066801] Published Mon Aug 03, 2015
Keywords:
Condensed Matter: Electronic Properties, etc.
Print ISSN:
0031-9007
Electronic ISSN:
1079-7114
Topics:
Physics
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