Publication Date:
2014-04-08
Description:
Author(s): A. Lupascu, J. P. Clancy, H. Gretarsson, Zixin Nie, J. Nichols, J. Terzic, G. Cao, S. S. A. Seo, Z. Islam, M. H. Upton, Jungho Kim, D. Casa, T. Gog, A. H. Said, Vamshi M. Katukuri, H. Stoll, L. Hozoi, J. van den Brink, and Young-June Kim We report x-ray resonant magnetic scattering and resonant inelastic x-ray scattering studies of epitaxially strained Sr2IrO4 thin films. The films were grown on SrTiO3 and (LaAlO3)0.3(Sr2AlTaO6)0.7 substrates, under slight tensile and compressive strains, respectively. Although the films develop a m... [Phys. Rev. Lett. 112, 147201] Published Mon Apr 07, 2014
Keywords:
Condensed Matter: Electronic Properties, etc.
Print ISSN:
0031-9007
Electronic ISSN:
1079-7114
Topics:
Physics
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