ISSN:
1432-0630
Keywords:
PACS: 61.16.Ch; 07.79.Lh; 42.70.Nq; 42.65.Hw
Source:
Springer Online Journal Archives 1860-2000
Topics:
Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
,
Physics
Notes:
12 SiO20 and BaTiO3 crystals. In contrast to conventional optical investigations of photorefractivity, where volume gratings of the refractive index are indirectly observed, the AFM allows a direct study of the charge gratings at the surface. Charge images of the two crystal materials are compared. The saturation of the charge gratings at increasing laser fluence is measured for both materials. From the observation of the phase shift between the light-intensity grating and the charge grating, the polarity of the charge carriers in Bi12SiO20 is determined.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1007/s003390051158
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