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  • 1
    Electronic Resource
    Electronic Resource
    Application of a position-sensitive detector to atom probe microanalysis (1988)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 59 (1988), S. 862-866 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: A position-sensitive detector system based on a wedge-and-strip anode has been used to build a short flight-path atom probe which identifies both the chemical nature and position of single atoms field evaporated from the surface of a field-ion specimen. The detector also allows digitized field-ion images to be obtained from the region being analyzed. The prototype instrument has a lateral resolution during analysis of substantially below 1 nm, and a depth resolution of one atomic layer. Initial applications of the instrument to the analysis of nanometer-scale precipitates in metallic alloys has shown the capability of reconstructing the three-dimensional microstructure and microchemistry of materials.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1139794
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  • 2
    Electronic Resource
    Electronic Resource
    Scientific Information by Computer (1971)
    [s.l.] : Nature Publishing Group
    Nature 230 (1971), S. 153-156 
    Details
    ISSN: 1476-4687
    Source: Nature Archives 1869 - 2009
    Topics: Biology , Chemistry and Pharmacology , Medicine , Natural Sciences in General , Physics
    Notes: [Auszug] An evaluation of the Chemical Society's Chemical Titles information retrieval service compared with a parallel manual search of the literature has shown that, at least in certain disciplines, more than 90 per cent of the desired information can be obtained. This is quite adequate for most ...
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1038/230153a0
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  • 3
    Electronic Resource
    Electronic Resource
    Field-ion Microscopic Observation of a Stacking Fault in Pure Iron (1969)
    [s.l.] : Nature Publishing Group
    Nature 222 (1969), S. 637-639 
    Details
    ISSN: 1476-4687
    Source: Nature Archives 1869 - 2009
    Topics: Biology , Chemistry and Pharmacology , Medicine , Natural Sciences in General , Physics
    Notes: [Auszug] A glissile line defect in iron has been studied in detail by field-ion microscopy. The field-ion image is shown to be consistent with the presence of stacking faults on two distinct ...
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1038/222637a0
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  • 4
    Electronic Resource
    Electronic Resource
    Performance of an energy-compensated three-dimensional atom probe (1998)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 69 (1998), S. 49-58 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: A wide acceptance angle first-order reflectron lens has been incorporated into a three-dimensional atom probe (3DAP) to provide improved mass resolution. This new 3DAP instrument is capable of resolving isotopes in the mass spectrum, with resolutions better than m/Δm=500 full width at half maximum and 250 full width at 10% maximum. However, use of a reflectron for energy compensation within an imaging system means that improvements in mass resolution result in degradation of the spatial resolution. This article addresses the detailed design of the energy compensated 3DAP, and the minimization and compensation of chromatic aberrations in the imaging performance of the instrument. Some applications of the new instrument are included to illustrate its capabilities in the atomic-scale analysis of engineering alloys. © 1998 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1148477
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  • 5
    Electronic Resource
    Electronic Resource
    Design of a scanning atom probe with improved mass resolution (2000)
    [S.l.] : American Institute of Physics (AIP)
    Review of Scientific Instruments 71 (2000), S. 3016-3023 
    Details
    ISSN: 1089-7623
    Source: AIP Digital Archive
    Topics: Physics , Electrical Engineering, Measurement and Control Technology
    Notes: A design for a high mass resolution scanning atom probe is described, which utilizes a two-conductor microelectrode held at 10–100 μm from the specimen. Field evaporation pulses are applied to the part of the counter-electrode closest to the specimen, while the output is maintained at ground. If the gap between the two conductors is small, field evaporated ions pass through the microelectrode while the pulse voltage is essentially constant, and thus the resultant spread in ion energies is small and the mass resolution in time-of-flight mass spectrometry is correspondingly improved. Initial results indicate improvements of 4–5 times over the mass resolution obtained with a simple counter electrode. © 2000 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.1304877
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  • 6
    Electronic Resource
    Electronic Resource
    Microstructure and domain studies in Alnico 5 and Alnico 7 (abstract) (1985)
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 57 (1985), S. 4173-4173 
    Details
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Magnetization processes in Alnico alloys depend on details of the microstructure on a very fine scale. In this paper, we report the results of studies carried out in more detail and at higher resolution than any previous study. Field ion microscopy (FIM) and atom probe microanalysis (AP) were used for microstructure studies, and high-voltage electron microscopy (HVEM) for studies of both the microstructure and magnetization processes. The composition of the two phases was studied with the new VG Scientific FIM100 AP recently installed in Oxford. Its high mass resolution and vacuum of 10−11 mbar have enabled the composition of the two phases to be accurately determined. The results differ significantly from another recent determination. Information has also been obtained on the ordering of both phases, their interconnectivity and the nature of the interfaces between them. Both phases were found to be partially ordered. In Alnico 5, both isolated and interconnected particles were found. The HVEM has been used to study the microstructure over larger areas, and to study the domain structure. In Alnico 7, particles of the strongly magnetic phase appeared to be more isolated than in Alnico 5, but this result is still to be confirmed by AP. It has also been possible to carry out in situ magnetization studies in the HVEM on specimens heat treated to reduce the coercivity. In Alnico 5, domain wall motion has been observed. In Alnico 7, domains have been observed for the first time. A new model for the coercivity is proposed in the light of these results, which agrees well with both the present results and those of other workers. Studies continuing at present should enable the differences between the magnetic properties of Alnico 5 and Alnico 7 to be explained.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.334654
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  • 7
    Electronic Resource
    Electronic Resource
    Three-dimensional atom probe field-ion microscopy observation of Cu/Co multilayer film structures (1998)
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 73 (1998), S. 1125-1127 
    Details
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Focused ion-beam milling has been used to fabricate field-ion specimens from a multilayer film structure containing 100 repetitions of a (Cu2 nm/Co2 nm) bilayer deposited directly onto a planar substrate. The as-deposited films showed a magnetoresistance ratio of ∼5% over a 250 Oe range at room temperature, and a coercivity of ∼60 Oe. The magnetic data suggest that the films are coupled ferromagnetically. Successful field-ion specimen preparation has allowed the observation of these layers by field-ion imaging and three-dimensional atom probe compositional analysis. Examination of the multilayer images reveals that, in some regions, the layers are nonparallel, but the interfaces are chemically quite sharp, with a diffuse interface region of ∼3 atomic layers. In addition, in some areas adjacent cobalt layers appear to be in contact. The fact that the layers are wavy suggests that the ferromagnetic coupling may be a result of Néel "orange peel" type magnetostatic coupling between adjacent cobalt layers. The relatively high coercivity may be a result of the poor layer planarity leading to a high number of domain wall pinning sites. © 1998 American Institute of Physics.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.122104
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  • 8
    Electronic Resource
    Electronic Resource
    Atom probe analysis of a ceramic oxide superconductor (1988)
    Woodbury, NY : American Institute of Physics (AIP)
    Applied Physics Letters 52 (1988), S. 1020-1022 
    Details
    ISSN: 1077-3118
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Field-ion specimens have been produced from a bulk ceramic yttrium barium cuprate superconductor, allowing quantitative atom probe analysis from this new class of materials. This technique offers the potential for high-resolution quantitative analysis for oxygen concentrations in the near-surface regions and the study of microchemistry of contact/superconductor interfaces. Preliminary results are presented on bulk compositions and the surface modifications following vacuum annealing.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1063/1.99232
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  • 9
    Electronic Resource
    Electronic Resource
    A versatile time-of-flight atom probe for metallurgical applications (1979)
    Chichester [u.a.] : Wiley-Blackwell
    Surface and Interface Analysis 1 (1979), S. 149-160 
    Details
    ISSN: 0142-2421
    Keywords: Chemistry ; Polymer and Materials Science
    Source: Wiley InterScience Backfile Collection 1832-2000
    Topics: Physics
    Notes: A computer-controlled atom prove time-of-flight mass spectrometer system is described which permits quantitative microanalysis to be undertaken at the 1-2 nm level. Distinctive features of the system include the use of a Johnston detector, to give low noise, high gain and high detection efficiency; incorporation of a movable channel plate and screen assembly, to provide a variable aperture; and the development of a comprehensive set of computer plate and screen assembly, to provide a variable aperture; and the development of a comprehensive set of computer software, to assist in the processing of data and presentation of analytical results. The system has been used successfully in a number of metallurgical investigations. In this paper, particular attention is given to describing the operating conditions required to achieve optimum performances, and to discussing the questions of background noise reduction and the deconvolution of spectra. The quantitative analysis capability of the instrument is demonstrated by reference to the results obtained from a range of standard materials, including steels. Applications to problems of metallurgical interest are illustrated by the analysis of ultra-fine particles in a Cu/Co alloy, and the analysis of carbides and carbide-matrix interfaces in a 2¼Cr/1Mo steel. The spatial resolution obtainable under different operating conditions is discussed, and the particular problems involved in the study of interfaces by this technique are described in detail.
    Additional Material: 11 Ill.
    Type of Medium: Electronic Resource
    URL: http://dx.doi.org/10.1002/sia.740010504
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  • 10
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    Application of a position‐sensitive detector to atom probe microanalysis (1988)
    American Institute of Physics
    Details
    Publication Date: 1988-06-01
    Print ISSN: 0034-6748
    Electronic ISSN: 1089-7623
    Topics: Electrical Engineering, Measurement and Control Technology , Physics
    Published by American Institute of Physics
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