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  • 1
    Electronic Resource
    Electronic Resource
    Amsterdam : Elsevier
    Physics Letters A 67 (1978), S. 56-58 
    ISSN: 0375-9601
    Source: Elsevier Journal Backfiles on ScienceDirect 1907 - 2002
    Topics: Physics
    Type of Medium: Electronic Resource
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  • 2
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 79 (1996), S. 5648-5648 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: High-frequency recording is essential for a recording channel with both a high data rate and a high linear recording density, and this study examined the ways in which performances are affected by the switching time of the write current, ts, and the disk velocity, v. The switching time, defined as (tr+tf)/2, where tr and tf are the rise time and the fall time of the write current, was changed from 5 to 20 ns, while v was changed from 12 to 26 m/s. Co-based thin-film media with a coercivity of about 2.5 kOe and a remanence-thickness product of about 100 G μm were used for recording the data. The flying height of the head was maintained at 50 nm regardless of disk velocity. This study confirmed that the overwrite characteristics are strongly related to the product of ts and v. Overwrite here was defined as the ratio of the residual fundamental frequency component amplitude of a 21 kFCI signal to the original one after overwriting with a 86 kFCI signal. Suitable overwrite characteristics were obtained when t*sv was smaller than πa, where a is the transition parameter derived from the equation proposed by Williams and Comstock. The transition length on the medium was determined primarily by πa when t*sv was smaller than πa, but was determined by t*sv when t*sv was larger than πa. Linear density characteristics and noise characteristics and their relationship to the medium properties will also be addressed in this talk. © 1996 American Institute of Physics.
    Type of Medium: Electronic Resource
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  • 3
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The crystal structure and magnetic properties of Co-alloy films deposited by KrF excimer laser ablation were investigated. A pulsed laser beam with wavelength of 248 nm was focused onto the deposition targets which were fixed in the vacuum chamber. Cr underlayer and Co-alloy films were successively deposited at a rate of 0.012 nm/pulse. The film surface was microscopically smooth compared to the sputtered films. This may be due to the low shadowing effect during the laser deposition. The composition of the film was reproducibly controlled, though there was a slight difference between the composition of film and target material. The coercivities of Co-Cr-Pt/Cr films formed on the Si and Ni-P substrates at 250 °C were 130 and 220 Oe, which were about one-fifth of the coercivity of sputtered films. Crystallographic analyses showed that Cr underlayer had no crystal orientation, and Co-alloy film consisted of fine fcc-type crystal grains. Low coercivity of the laser-deposited film is probably due to the lack of hcp Co phase.
    Type of Medium: Electronic Resource
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  • 4
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: A Cr-Ti underlayer is found to enhance the in-plane coercive forces of Co-Cr-Pt and Co-Cr-Ta films; the maximum coercive force was 3.5 kOe for (CoCr0.15)0.84Pt0.16/CrTi0.2. The crystallites of Cr-Ti grow in a more highly oriented and uniform manner than ones of Cr, and their lattice spacings are closer to those of Co alloys than Cr, improving the epitaxial growth of Co-alloy crystallites with c-axis in-plane oriented components on the Cr-Ti underlayer. The crystalline anisotropy constant of Co-Cr-Pt with a high Pt concentration is found by torque measurement to be larger than that of Co-Cr-Ta. These can produce extremely high coercive forces in Co-Cr-Pt/Cr-Ti. The C/Co-Cr-Pt/Cr-Ti thin film media with high coercive forces show excellent read/write characteristics; the linear densities at 50% signal drop are very high, 175 and 101 kFCI, for the C/Co-Cr-Pt/Cr-Ti media at head-to-magnetic layer spacings of 0.01 and 0.07 μm.
    Type of Medium: Electronic Resource
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  • 5
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Spin-polarized scanning electron microscopy (spin SEM) to observe magnetic domains has the potential for spatial resolution as high as 10 nm. The best resolution from spin SEMs attained so far, however, is around 50 nm. In this talk, we report a newly developed spin SEM with 20 nm resolution. The major factor determining the resolution of a spin SEM is probe diameter. A smaller probe diameter, however, results in lower probe current. This is a serious issue in spin SEM because the efficiency of a spin detector is very low. Thus, to get high resolution with a reasonable signal/noise (S/N) image, higher efficiency in the spin detector and/or higher probe current are needed in addition to get a smaller probe diameter. The higher probe current has been attained by using a thermal assisted field emission cathode in an electron gun. The higher efficiency in the spin detector was achieved by increasing the acceptance angle of electron detectors inside the spin detector and optimizing both a secondary collector and transport optics. Obtaining a smaller probe diameter required a low aberration objective lens and a short working distance. Those were achieved by computer calculation so that there was no interference between the objective lens and the secondary collector. This achieved both a short working distance of 20 mm and high secondary collection efficiency. As a result, magnetic images of 20 nm resolution with a 25 keV and 1 nA probe beam have been attained. We have applied this spin SEM to observing recorded bits of longitudinal thin film media at high recording densities.
    Type of Medium: Electronic Resource
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  • 6
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: A transmission electron microscope operating with a cold field emission source has been modified to facilitate differential phase contrast mapping and applied to the observation of microscopic magnetic features appearing in recorded longitudinal media. After describing the design and performance of the scanning Lorentz electron microscope, as we call it, results on the observation of bit patterns delineated on Co-based sputtered longitudinal media are presented. Relations of observed bit profiles to macroscopic magnetic properties of media and to device performance are discussed. Then, magnetization fluctuation on a scale of magnetic crystallites constituting the medium is examined. Also given is an account of a stray field effect inherent in hard magnetic materials.
    Type of Medium: Electronic Resource
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  • 7
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 62 (1987), S. 3694-3699 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: Crystallographic and electrical properties of Fe/Cr and Cu/Ni superlattices synthesized by e-beam evaporation have been analyzed. The films of Fe/Cr and Cu/Ni have strong (110) and (111) textures, respectively. X-ray linewidths of both systems were studied and found to be broadest at a layer period of about 10 atomic planes. The in-plane electrical resistivities were found to closely correlate with the x-ray linewidths. The behavior of both properties is accounted for by considering the roughness of the interface induced by misfit dislocations arising from the relaxation of coherency strain. Our analysis uses a modified paracrystalline theory for x-ray line broadening and a modified Soffer theory for the electrical resistivity.
    Type of Medium: Electronic Resource
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  • 8
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 61 (1987), S. 3143-3145 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The magnetic properties and the c axis orientation of Co-Cr thin films deposited on various substrates with concentrations of 0–20 at. % Cr are investigated. The intermediate layer of C,5 nm thick, between the substrate and Co-Cr layer is found to bring a great improvement in the c-axis orientation toward the normal of the film plane, a situation suitable for perpendicular recording. On the other hand, the thicker the underlayer of Cr, the better the c-axis orientation and a higher coercivity in the film plane is realized; this is suitable for longitudinal recording.
    Type of Medium: Electronic Resource
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  • 9
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 57 (1985), S. 3961-3963 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The coercivity dependence of read/write and noise characteristics are investigated for the probe-type thin-film head using multilayered Fe-Si-Ru films and Co-Cr/Co-Zr-Mo double-layer media. The D50 recording density of 100 kFCI (flux change per inch) and the output of 0.24 μVpp/μm turn m/s are obtained for the medium with the coercivity of 500 Oe. These characteristics are superior to those for conventional ring head (D50=80 kFCI, E1k=0.12 μVpp/μm turn m/s). Further, thin-film heads have low noise and high overwrite characteristics.
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  • 10
    Electronic Resource
    Electronic Resource
    [S.l.] : American Institute of Physics (AIP)
    Journal of Applied Physics 57 (1985), S. 3964-3966 
    ISSN: 1089-7550
    Source: AIP Digital Archive
    Topics: Physics
    Notes: The read/write and noise characteristics of Co-Cr/Co-Zr-Mo double-layer media are investigated with a conventional Mn-Zn ferrite ring head of 0.3-μm gap length in comparison with single-layer media. Almost the same D50 recording density of 80 kFCI are obtained for both double- and single-layer media with a coercivity of 500 Oe. The double-layer media/ring head combination has superior output and overwrite characteristics but inferior noise characteristics to those of a single-layer/ring head.
    Type of Medium: Electronic Resource
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