Publication Date:
2019-07-10
Description:
A fifth set of heavy ion single event effects (SEE) test data have been collected since the last IEEE publications (1,2,3,4) in December issues for 1985, 1987, 1989, and 1991. Trends in SEE susceptibility (including soft errors and latchup) for state-of-the-art parts are evaluated.
Keywords:
Electronics and Electrical Engineering
Type:
AD-A345739
,
TR-93(3940)-4
,
SMC-TR-98-16
Format:
application/pdf
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