ISSN:
1551-2916
Source:
Blackwell Publishing Journal Backfiles 1879-2005
Topics:
Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
,
Physics
Notes:
Conduction mechanisms in tin oxide-based thick-film resistors have been investigated using impedance spectroscopic measurements. The sheet resistance, obtained by analyzing these impedance spectra, exhibits two regions of temperature dependence. The behavior in region I (room temperature to } 200°C) can be explained satisfactorily in terms of variable-range hopping conduction and in region II (200° to }350C) by a diffusion model. It is assumed that ionic tin dissolved in glass serves as the hopping sites in region I. At higher temperatures, these tin ions may participate in an ion-exchange-type diffusion that results in region II behavior.
Type of Medium:
Electronic Resource
URL:
http://dx.doi.org/10.1111/j.1151-2916.1997.tb02964.x
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